Full name Familienname, Vorname
Schwenzfeier, Kai Alexander
 
Main Affiliation Organisations­zuordnung
 

Results 1-8 of 8 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Schwenzfeier, Kai A ; Valtiner, Markus Design and testing of drift free force probe experiments with absolute distance controlArticle Artikel Jul-2022
2Schwenzfeier, Kai Alexander Extending the Analysis of Multiple Beam Interferometry in the Surface Forces ApparatusPresentation Vortrag16-May-2022
3Schwenzfeier Kai Alexander - 2022 - Development of an interferometry-based...pdf.jpgSchwenzfeier, Kai Alexander Development of an interferometry-based drift-compensated scanning probe microscopy technique to measure surface forces (Molecular Forces Apparatus, MFA)Thesis Hochschulschrift 2022
4Wieser-2021-Journal of Vacuum Science and Technology A Vacuum, Surfaces a...-vor.pdf.jpgWieser, Valentina ; Bilotto, Pierluigi ; Ramach, Ulrich ; Yuan, Hui ; Schwenzfeier, Kai Alexander ; Cheng, Hsiu-Wei ; Valtiner, Markus Novel in situ sensing surface forces apparatus for measuring gold versus gold, hydrophobic, and biophysical interactionsArticle Artikel 1-Mar-2021
5Wieser, Valentina ; Bilotto, Pierluigi ; Ramach, Ulrich ; Yuan, Hui ; Schwenzfeier, Kai ; Cheng, Hsiu-Wei ; Valtiner, Markus Novel in situ sensing surface forces apparatus for measuring gold versus gold, hydrophobic, and biophysical interactionsArtikel Article 2021
6Schwenzfeier-2019-The Review of scientific instruments-vor.pdf.jpgSchwenzfeier, Kai Alexander ; Erbe, Andreas ; Bilotto, Pierluigi ; Lengauer, Maximilian Michael ; Merola, Claudia ; Cheng, Hsiu-Wei ; Mears, Laura Louise Elizabeth ; Valtiner, Markus Optimizing multiple beam interferometry in the surface forces apparatus: Novel optics, reflection mode modeling, metal layer thicknesses, birefringence, and rotation of anisotropic layersArticle Artikel Apr-2019
7Schwenzfeier, Kai A. Optimizing Multiple Beam Interferometry in the Surface Forces ApparatusPräsentation Presentation2019
8Schwenzfeier, Kai A. Reflection Mode Interferometry for studying interfacial processesPräsentation Presentation2019