Full name Familienname, Vorname
Fabry, L.
 


Results 1-17 of 17 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Streli, Christina ; Wobrauschek, Peter ; Fabry, L. ; Pahlke, S. ; Comin, F. ; Barrett, R. ; Pianetta, P. ; Lüning, K. ; Beckhoff, B. Total-Reflection X-Ray Fluorescence (TXRF) Wafer AnalysisBuchbeitrag Book Contribution2006
2Streli, Christina ; Wobrauschek, Peter ; Jokubonis, C. ; Pepponi, Giancarlo ; Mantler, Michael ; Fabry, L. ; Falkenberg, G. Investigation of Cu-Gettering on Si wafer structures using SR-muXRFBericht Report2005
3Wobrauschek, Peter ; Osmic, F. ; Streli, Christina ; Pahlke, S. ; Fabry, L. Si drift detector versus Si(Li) detector for TXRF applicationsPräsentation Presentation2002
4Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Zöger, N. ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. Synchrotron Radiation induced TXRF of low Z Elements on Si Wafer Surfaces at SSRL.Beamline 3-3Präsentation Presentation2002
5Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. Synchrotron Radiation induced TXRF of low Z Elements: Analysis of Si Wafer Surfaces at the PTB Undulator PGB Beamline at BESSYIIPräsentation Presentation2002
6Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W. Analysis of low Z Elements on Si Wafer Surfaces with Synchrotron Radiation induced TXRF at SSRL.Beamline 3-3: Comparison of Droplets with Spin coated WafersPräsentation Presentation2002
7Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W. Synchrotron Radiation induced TXRF of low Z Elements on Si Wafer Surfaces at SSRL.Beamline 3-3: Surface Contaminations and Depth ProfilesPräsentation Presentation2002
8Osmic, F. ; Wobrauschek, Peter ; Streli, Christina ; Pahlke, S. ; Fabry, L. A Si Drift Detector and a Si(Li) Detector in a TXRF Spectrometer for Wafer Analysis: A ComparisonPräsentation Presentation2002
9Ehmann, T. ; Pepponi, Giancarlo ; Beckhoff, B. ; Fabry, L. ; Streli, Christina ; Wobrauschek, Peter ; Ulm, G. ; Pahlke, S. Investigation of organic Contaminations on Si Wafers by TXRF-NEXAFSPräsentation Presentation2002
10Osmic, F. ; Wobrauschek, Peter ; Streli, Christina ; Pahlke, S. ; Fabry, L. Comparison of a Si drift detector with a Si(Li) detector in a TXRF spectrometer for wafer analysisPräsentation Presentation2002
11Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. Synchrotron radiation induced TXRF of low Z elements at the PTB undulator beamline at BESSY II: analysis of Si wafer surfacesPräsentation Presentation2002
12Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W. Synchrotron radiation induced TXRF of low Z elements on Si wafer surfaces at SSRL beamline 3-3Präsentation Presentation2002
13Pepponi, Giancarlo ; Beckhoff, B. ; Ehmann, T. ; Streli, Christina ; Wobrauschek, Peter ; Ulm, G. ; Pahlke, S. ; Fabry, L. Analysis of intentionally contaminated Si Wafers with TXRF-NEXAFSPräsentation Presentation2002
14Pepponi, Giancarlo ; Streli, Christina ; Beckhoff, B. ; Ulm, G. ; Ehmann, T. ; Pahlke, S. ; Fabry, L. NEXAFS Spectroscopy of Organic Contamination on Si Wafers by TXRFPräsentation Presentation2002
15Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. Analysis of low Z Elements on Si Wafer Surfaces with Synchrotron Radiation induced TXRF of low Z Elements at the PTB Undulator Beamline at BESSYPräsentation Presentation2002
16Pepponi, Giancarlo ; Beckhoff, B. ; Ehmann, T. ; Ulm, G. ; Streli, Christina ; Pahlke, S. ; Fabry, L. NEXAFS Spectroscopy of organic Contamination on Si Wafers by TXRF: First ResultsPräsentation Presentation2002
17Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. Synchrotron Radiation induced TXRF of low Z Elements: Analysis of Si Wafer Surfaces at the PTB Undulator Beamline at BESSY II - recent ResultsPräsentation Presentation2002



Results 1-1 of 1 (Search time: 0.001 seconds).

PreviewEditor(s)TitleTypeIssue Date
1Streli, Christina ; Wobrauschek, Peter ; Fabry, L. ; Pahlke, S. ; Comin, F. ; Barrett, R. ; Pianetta, P. ; Lüning, K. ; Beckhoff, B. Total-Reflection X-Ray Fluorescence (TXRF) Wafer AnalysisBuch Book2006