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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Kregsamer, Peter ; Nutsch, A. ; Borionetti, G. ; Beckhoff, B. ; Müller, M. ; Polignano, M.L. ; Pepponi, Giancarlo ; Fittschen, U. ; Streli, Christina | Round robin test for TXRF and ToF-SIMS on various types of Ni samples on Si wafer surfaces within the network ANNA | Präsentation Presentation | 2011 |
| 2 | | Pepponi, Giancarlo ; Giubertoni, D. ; Bersani, M. ; Meirer, F. ; Ingerle, D. ; Steinhauser, Georg ; Streli, Christina ; Hoenicke, P. ; Beckhoff, B. | Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon | Artikel Article | 2010 |
| 3 | | Beckhoff, B. ; Kolbe, M. ; Müller, M. ; Nutsch, A. ; Altmann, R. ; Borionetti, G. ; Pello, C. ; Polgnano, M.L. ; Codegoni, C. ; Grasso, S. ; Cazzini, E. ; Bersani, M. ; Lazzeri, P. ; Gennaro, S. ; Kregsamer, Peter ; Posch, F. | Investigation of Spin-coated inorganic contamination on Si surfacs by various analytical techniques | Präsentation Presentation | 2010 |
| 4 | | Nutsch, A. ; Beckhoff, B. ; Altmann, R. ; Polignano, M.L. ; Cazzini, E. ; Codegoni, D. ; Borionetti, G. ; Kolbe, M. ; Müller, M. ; Mantler, C. ; Streli, Christina | Comparability of TXRF Systems at different laboratories | Präsentation Presentation | 2009 |
| 5 | | Pepponi, Giancarlo ; Meirer, F. ; Giubertoni, D. ; Ingerle, D. ; Steinhauser, Georg ; Streli, Christina ; Hoenicke, P. ; Beckhoff, B. ; Bersani, M. | Grazing Incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for characterization of ultra shallow arsenic distribution in silicon | Präsentation Presentation | 2009 |
| 6 | | Giubertoni, D. ; Pepponi, Giancarlo ; Beckhoff, B. ; Hoenicke, P. ; Gennaro, S. ; Meirer, F. ; Ingerle, D. ; Steinhauser, Georg ; Fried, M. ; Petrik, P. ; Parisini, A. ; Reading, M.A. ; Streli, Christina ; van den Berg, J.A. ; Bersani, M. | Multi-technique characterization of arsenic ultra shallow junctions in silicon within the ANNA consortium | Präsentation Presentation | 2009 |
| 7 | | Nutsch, A. ; Beckhoff, B. ; Altmann, R. ; Polignano, M.L. ; Borionetti, G. ; Kregsamer, Peter ; Streli, Christina ; Pepponi, Giancarlo | Comparison of TXRF Systems from Si wafer surface analysis at different laboratories of ANN | Präsentation Presentation | 2009 |
| 8 | | Nutsch, A. ; Beckhoff, B. ; Altmann, R. ; Polignano, M.L. ; Borionetti, G. ; Kolbe, M. ; Müller, M. ; Mantler, C. ; Streli, Christina | Comparability of TXRF Systems at different laboratories | Konferenzbeitrag Inproceedings | 2009 |
| 9 | | Nutsch, A. ; Beckhoff, B. ; Altmann, R. ; van den Berg, J.A. ; Giubertoni, D. ; Hoenicke, P. ; Bersani, M. ; Leibold, A. ; Meirer, F. ; Müller, M. ; Pepponi, Giancarlo ; Otto, M. ; Petrik, P. ; Reading, M.A. ; Pfitzner, L. ; Ryssel, H. | Complementary metrology within a European joint laboratory | Konferenzbeitrag Inproceedings  | 2009 |
| 10 | | Beckhoff, B. ; Nutsch, A. ; Altmann, R. ; Borionetti, G. ; Pello, C. ; Polignano, M.L. ; Codegoni, D. ; Grasso, S. ; Cazzini, E. ; Bersani, M. ; Gennaro, S. ; Kolbe, M. ; Müller, M. ; Kregsamer, Peter ; Posch, F. | Assessing Various Analytical Techniques With Different Lateral Resolution By Investigating Spin-coated Inorganic Contamination On Si Surfaces | Konferenzbeitrag Inproceedings | 2009 |
| 11 | | Beckhoff, B. ; Nutsch, A. ; Altmann, R. ; Borionetti, G. ; Pello, C. ; Polignano, M.L. ; Codegoni, D. ; Grasso, S. ; Cazzini, E. ; Bersani, M. ; Lazzeri, P. ; Gennaro, S. ; Kolbe, M. ; Müller, M. ; Kregsamer, Peter ; Posch, F. | Highly sensitive detection of inorganic contamination | Konferenzbeitrag Inproceedings | 2009 |
| 12 | | Beckhoff, B. ; Nutsch, A. ; Altmann, R. ; Borionetti, G. ; Pello, C. ; Polignano, M.L. ; Codegoni, D. ; Grasso, S. ; Cazzini, E. ; Bersani, M. ; Lazzeri, P. ; Gennaro, S. ; Kolbe, M. ; Müller, M. ; Kregsamer, Peter ; Posch, F. | Assessing various analytical techniques with different lateral resolution by investigating spin-coated inorganic contamination on Si surfaces | Präsentation Presentation | 2009 |
| 13 | | Beckhoff, B. ; Kolbe, M. ; Hahn, O. ; Karydas, A.G. ; Zarkadas, Ch. ; Sokaras, D. ; Mantler, Michael | Reference-free x-ray fluorescence analysis of an ancient Chinese ceramic | Artikel Article | 14-May-2008 |
| 14 | | Pepponi, Giancarlo ; Giubertoni, D. ; Bersani, M. ; Zöger, N. ; Streli, Christina ; Beckhoff, B. ; Hoenicke, P. ; Kolbe, M. ; Müller, M. ; Meirer, F. | Grazing Incidence X-Ray Fluorescence characterisation of Ultra Shallow Junctions in the ANNA consortium | Präsentation Presentation | 2008 |
| 15 | | Beckhoff, B. ; Kolbe, M. ; Mantler, Michael | Reference-free X-ray fluorescence analysis | Präsentation Presentation | 2007 |
| 16 | | Mantler, Michael ; Beckhoff, B. ; Kolbe, M. ; Hahn, O. ; Karydas, A.G. ; Zarkadas, Ch. ; Sokaras, D. | Reference-free X-ray fluorescence analysis: Part 2: Theoretical Considerations | Präsentation Presentation | 2007 |
| 17 | | Beckhoff, B. ; Kolbe, M. ; Hahn, O. ; Karydas, A.G. ; Zarkadas, Ch. ; Sokaras, D. ; Mantler, Michael | Reference-free X-ray fluorescence analysis with synchrotron radiation | Präsentation Presentation | 2007 |
| 18 | | Beckhoff, B. ; Gerlach, M. ; Kolbe, M. ; Müller, Martin ; Ulm, G. ; Karydas, A.G. ; Zarkadas, Ch. ; Geralis, T. ; Kousuris, K. ; Kawahara, N. ; Yamada, T. ; Mantler, Michael | Enhancement of x-ray fluorescence of light elements by photoelectron secondary excitation | Präsentation Presentation | 2006 |
| 19 | | Streli, Christina ; Wobrauschek, Peter ; Fabry, L. ; Pahlke, S. ; Comin, F. ; Barrett, R. ; Pianetta, P. ; Lüning, K. ; Beckhoff, B. | Total-Reflection X-Ray Fluorescence (TXRF) Wafer Analysis | Buchbeitrag Book Contribution | 2006 |
| 20 | | Beckhoff, B. ; Gerlach, M. ; Kolbe, M. ; Müller, Martin ; Ulm, G. ; Karydas, A.G. ; Zarkadas, Ch. ; Geralis, T. ; Kousouris, K. ; Kawahara, N. ; Yamada, T. ; Mantler, Michael | Quantitative investigation of the enhancement of X-ray fluorescence of light elements by photoelectron secondary exitation | Präsentation Presentation | 2005 |