Name Card

Full name Familienname, Vorname
Riechert, H.
 

Own Publications Eigene Publikationen

Results 1-10 of 10 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Koblmüller, G. ; Averbeck, R. ; Riechert, H. ; Hyun, Y.-J. ; Pongratz, P. Strain relaxation dependent island nucleation rates during the Stranski-Krastanow growth of GaN on AlN by molecular beam epitaxyArtikel Article2008
2Koblmüller, G. ; Pongratz, Peter ; Joo, Hyun Youn ; Averbeck, R. ; Riechert, H. ; Speck, James Effect of Ga adlayer on strain and nucleation rates during GaN quantum dot groth on AINPräsentation Presentation2006
3Pongratz, Peter ; Koblmüller, G. ; Riechert, H. ; Hyun, Youn Joo ; Speck, James ; Averbeck, R. TEM analysis of dislocations in AIN and GaN heterostructures grown on saphhire and SiC gy plasma assisted MBEPräsentation Presentation2006
4Koblmüller, G. ; Brown, Jay ; Averbeck, R. ; Riechert, H. ; Pongratz, Peter ; Speck, James Continuous evolution of Ga adlayer coverages during plasma-assisted molecular-beam epitaxy of (0001) GaNArtikel Article2005
5Koblmüller, G. ; Brown, Jay ; Averbeck, R. ; Riechert, H. ; Pongratz, Peter ; Speck, James Ga Adlayer Governed Surface Defect Evolution of (0001)GaN Films Grown by Plasma-Assisted Molecular Beam EpitaxyArtikel Article2005
6Koblmüller, G. ; Brown, Jay ; Averbeck, R. ; Riechert, H. ; Pongratz, Peter ; Petroff, Pierre M. ; Speck, James Quantification of Ga surface coverages and their desorption kinetics on GaN (0001) and (000-1) surfacesArtikel Article2005
7Koblmüller, G. ; Brown, Jay ; Averbeck, R. ; Riechert, H. ; Pongratz, Peter ; Speck, James Quantification of Ga sufrace coverages and their desorption kinetics an GaN (0001) and (000-1) surfacesPräsentation Presentation2004
8Brown, Jay ; Koblmüller, G. ; Averbeck, R. ; Riechert, H. ; Pongratz, Peter ; Petroff, Pierre M. ; Speck, James Quantification of Dynamic Ga Coverage and GaN Quantum Dot Formation on AINPräsentation Presentation2004
9Koblmüller, G. ; Averbeck, R. ; Riechert, H. ; Pongratz, Peter GaN growth modes during molecular beam epitaxy on AIN observed by in situ line-of-sight quadrupole mass spectrometryPräsentation Presentation2003
10Koblmüller, G. ; Averbeck, R. ; Riechert, H. ; Pongratz, Peter Growth diagram for MBE growth of AIN thin filmsPräsentation Presentation2003

Contributing Publications Mitbeteiligte Publikationen

Results 1-2 of 2 (Search time: 0.001 seconds).

PreviewEditor(s)TitleTypeIssue Date
1Janes, David B. ; Riechert, H. ; Machida, Tomoki ; Conley, J. F. ; Weinbub, Josef ; Goodnick, S.M. Innovative Nanoscale Devices and SystemsBuch Book 2019
2Weinbub, Josef ; Jonker, B. ; Riechert, H. ; Machida, Tomoki ; Goodnick, S.M. ; Selberherr, Siegfried Innovative Nanoscale Devices and SystemsBuch Book 2018