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Kanngießer, B.
 

Own Publications Eigene Publikationen

Results 1-9 of 9 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Zöger, N. ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. Synchrotron Radiation induced TXRF of low Z Elements on Si Wafer Surfaces at SSRL.Beamline 3-3Präsentation Presentation2002
2Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. Synchrotron Radiation induced TXRF of low Z Elements: Analysis of Si Wafer Surfaces at the PTB Undulator PGB Beamline at BESSYIIPräsentation Presentation2002
3Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W. Analysis of low Z Elements on Si Wafer Surfaces with Synchrotron Radiation induced TXRF at SSRL.Beamline 3-3: Comparison of Droplets with Spin coated WafersPräsentation Presentation2002
4Pepponi, Giancarlo ; Streli, Christina ; Wobrauschek, Peter ; Zöger, N. ; Pianetta, P. ; Baur, K. ; Kanngießer, B. ; Malzer, W. ; Palmetshofer, L. Measurements of light Element Implants in Si Wafers with SR-TXRFPräsentation Presentation2002
5Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W. Synchrotron Radiation induced TXRF of low Z Elements on Si Wafer Surfaces at SSRL.Beamline 3-3: Surface Contaminations and Depth ProfilesPräsentation Presentation2002
6Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. Synchrotron radiation induced TXRF of low Z elements at the PTB undulator beamline at BESSY II: analysis of Si wafer surfacesPräsentation Presentation2002
7Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W. Synchrotron radiation induced TXRF of low Z elements on Si wafer surfaces at SSRL beamline 3-3Präsentation Presentation2002
8Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. Analysis of low Z Elements on Si Wafer Surfaces with Synchrotron Radiation induced TXRF of low Z Elements at the PTB Undulator Beamline at BESSYPräsentation Presentation2002
9Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. Synchrotron Radiation induced TXRF of low Z Elements: Analysis of Si Wafer Surfaces at the PTB Undulator Beamline at BESSY II - recent ResultsPräsentation Presentation2002

Contributing Publications Mitbeteiligte Publikationen

Results 1-1 of 1 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Streli, Christina ; Wobrauschek, Peter ; Fabry, L. ; Pahlke, S. ; Comin, F. ; Barrett, R. ; Pianetta, P. ; Lüning, K. ; Beckhoff, B. Total-Reflection X-Ray Fluorescence (TXRF) Wafer AnalysisBuchbeitrag Book Contribution2006