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Full name Familienname, Vorname
Zöger, Norbert
 
Main Affiliation Organisations­zuordnung
 

Own Publications Eigene Publikationen

Results 1-20 of 110 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Roschger, A. ; Hofstaetter, J.G. ; Pemmer, B. ; Zoeger, N. ; Wobrauschek, P. ; Falkenberg, G. ; Simon, R. ; Berzlanovich, A. ; Thaler, H.W. ; Roschger, P. ; Klaushofer, K. ; Streli, C. Differential accumulation of lead and zinc in double-tidemarks of articular cartilageArtikel Article2013
2Roschger, Paul ; Manjubala, Inderchand ; Zöger, N. ; Meirer, F. ; Simon, Rolf ; Li, Chenghao ; Fratzl-Zelman, Nadja ; Misof, Barbara ; Paschalis, Eleftherios ; Streli, Christina ; Fratzl, Peter ; Klaushofer, Klaus Bone Material Quality in Transiliac Bone Biopsies of Postmenopausal Osteoporotic Women After 3 Years Strontium Ranelate TreatmentArtikel Article 9-Apr-2010
3Göttlicher, J. ; Meirer, F. ; Pemmer, B. ; Zöger, N. ; Streli, Christina ; Steininger, R. ; Mangold, S. ; Tampieri, A. ; Spiro, S. ; Pepponi, Giancarlo ; Hofstätter, J. ; Klaushofer, K. Speciation of Pb in Human Trabecular Bone and the Tidemark of Articular CartilagePräsentation Presentation2010
4Ingerle, D. ; Meirer, F. ; Zoeger, N. ; Pepponi, G. ; Giubertoni, D. ; Steinhauser, G. ; Wobrauschek, P. ; Streli, C. A new spectrometer for grazing incidence X-ray fluorescence for the characterization of Arsenic implants and Hf based high-k layersArtikel Article2010
5Ingerle, D. ; Meirer, F. ; Zöger, N. ; Pepponi, Giancarlo ; Giubertoni, D. ; Wobrauschek, Peter ; Streli, Christina Spectrometer for Grazing Incidence XRF: Characterization of As Implants and Hf LayerPräsentation Presentation2009
6Zöger, N. ; Streli, Christina ; Wobrauschek, Peter ; Jokubonis, C. ; Pepponi, Giancarlo ; Roschger, Paul ; Hofstätter, J. ; Berzlanovich, A. ; Simon, R. Determination of the elemental distribution in human joint bones by SR micro XRFBericht Report2009
7Streli, Christina ; Meirer, F. ; Wobrauschek, Peter ; Zöger, N. ; Pepponi, Giancarlo X-ray analysis using synchrotron radiationBericht Report2009
8Sasamori, S. ; Zöger, N. ; Streli, Christina ; Kregsamer, Peter ; Smolek, S. ; Wobrauschek, Peter ; Meirer, F. ; Mantler, C. Si Wafer Analysis Of Light Elements By Txrf - Chamber Adaption To Fit 6" And 8" WafersPräsentation Presentation2009
9Smolek, S. ; Streli, Christina ; Zöger, N. ; Wobrauschek, Peter ; Meirer, F. Micro X-Ray Fluorescence Spectrometer With Low Power Tube For Light Element AnalysisPräsentation Presentation2009
10Meirer, F. ; Pemmer, B. ; Zöger, N. ; Streli, Christina ; Göttlicher, J. ; Steininger, R. ; Mangold, S. ; Tampieri, A. ; Sprio, S. ; Pepponi, Giancarlo ; Hofstätter, J. ; Roschger, Paul ; Klaushofer, K. Speciation of Pb in the tidemark of human articular Cartilage using XANES at the SUL-X beamline of ANKAPräsentation Presentation2009
11Smolek, S. ; Zöger, N. ; Streli, Christina ; Wobrauschek, Peter ; Meirer, F. ; Horntrich, C. Micro-XRF Spectrometer for Light Element AnalysisPräsentation Presentation2009
12Zöger, N. ; Streli, Christina ; Meirer, F. ; Hofstätter, J. ; Roschger, Paul ; Wobrauschek, Peter ; Maderitsch, A. ; Smolek, S. ; Pepponi, Giancarlo ; Falkenberg, G. ; Simon, R. ; Berzlanovich, A. ; Klaushofer, K. Differential Accumulation of Trace elements in Double-tidemarks of Human Articular Cartilage in OsteoarthritisPräsentation Presentation2009
13Zöger, N. ; Meirer, F. ; Pemmer, B. ; Streli, Christina ; Göttlicher, J. ; Steininger, R. ; Mangold, S. ; Tampieri, A. ; Sprio, S. ; Pepponi, Giancarlo ; Hofstätter, J. ; Roschger, Paul ; Klaushofer, K. Speciation of Pb in the tidemark of human articular CartilagePräsentation Presentation2009
14Meirer, F. ; Zöger, N. ; Pemmer, B. ; Streli, Christina ; Göttlicher, J. ; Steininger, R. ; Mangold, S. ; Tampieri, A. ; Sprio, S. ; Pepponi, Giancarlo ; Hofstätter, J. ; Roschger, Paul ; Klaushofer, K. Speciation of Pb in the tidemark of human articular Cartilage usingmicro-XRF-XANESPräsentation Presentation2009
15Sasamori, S. ; Meirer, F. ; Zöger, N. ; Streli, Christina ; Kregsamer, Peter ; Smolek, S. ; Mantler, C. ; Wobrauschek, Peter Si wafer analysis of light elements by TXRF-study of absorption effects of metal contaminantsPräsentation Presentation2009
16Streli, Christina ; Meirer, F. ; Wobrauschek, Peter ; Zöger, N. ; Pepponi, Giancarlo X-ray analysis using synchrotron radiationPräsentation Presentation2009
17Ingerle, D. ; Meirer, F. ; Zöger, N. ; Pepponi, Giancarlo ; Giubertoni, D. ; Wobrauschek, Peter ; Streli, Christina A GIXRF laboratory insrument for the characterization of ultra shallow implants and thin filmsPräsentation Presentation2009
18Sasamori, S. ; Meirer, F. ; Zöger, N. ; Streli, Christina ; Kregsamer, Peter ; Smolek, S. ; Mantler, C. ; Wobrauschek, Peter Si wafer analysis of light elements by TXRFPräsentation Presentation2009
19Sasamori, S. ; Meirer, F. ; Zöger, N. ; Streli, Christina ; Kregsamer, Peter ; Smolek, S. ; Mantler, C. ; Wobrauschek, Peter Si wafer analysis of light elements by TXRF ╨ chamber adaption to fit 6╥ and 8╥ wafersPräsentation Presentation2009
20Ingerle, D. ; Zöger, N. ; Wobrauschek, Peter ; Streli, Christina ; Meirer, F. ; Pepponi, Giancarlo ; Giubertoni, D. Spectrometer For Grazing Incidence Xrf: Characterization Of As Implants And Hf LayersPräsentation Presentation2009