Name Card

Full name Familienname, Vorname
Fittschen, U.
 

Own Publications Eigene Publikationen

Results 1-20 of 52 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Iro, M. ; Ingerle, D. ; Streli, Christina ; Tsuji, K. ; Hampel, S. ; Lutz, C. ; Fittschen, U. F-07 STUDENT Investigation of the Transmission Properties of a Polycapillary Half-Lens and Their Effect on Quantification For Confocal µXRFPräsentation Presentation2021
2Kulow, A. ; Buzanich, G. ; Reinholz, Uwe ; Emmerling, F. ; Streli, Christina ; Hampel, S. ; Fittschen, U. ; Radtke, Martin Full-field X-ray fluorescence imaging with coded aperturesPräsentation Presentation2021
3Fittschen, U. ; Till, H. S. ; Hampel, S. ; Gross, A. ; Kulow, A. ; Buzanich, G. ; Reinholz, Uwe ; Radtke, Martin ; Ingerle, D. ; Streli, Christina Improving Surface Sensitive XRF Using Ink-Jet Printing and Information from the Angle Dependent SignalPräsentation Presentation2020
4Buzanich, G. ; Fittschen, U. ; Radtke, Martin ; Reinholz, Uwe ; Riesemeier, Heinrich ; Wobrauschek, Peter ; Streli, Christina TXRF-XANES: a unique experimental setup for chemical speciation of traces down to pg rangePräsentation Presentation2018
5Fittschen, U. ; Guilherme, A. ; Böttger, S. ; Rosenberg, D. ; Menzel, M. ; Jansen, W. ; Busker, M. ; Gotlib, Z.P. ; Radtke, Martin ; Riesemeier, H. ; Wobrauschek, Peter ; Streli, Christina A setup for synchrotron-radiation-induced total reflection X-ray fluorescence and X-ray absorption near-edge structure recently commissioned at BESSY II BAMlineArtikel Article May-2016
6Gotlib, Z.P. ; Fittschen, U. ; Böttger, S. ; Rosenberg, D. ; Jansen, W. ; Busker, M. ; Menzel, M. ; Guilherme, A. ; Radtke, Martin ; Riesemeier, Heinrich ; Wobrauschek, Peter ; Streli, Christina Setup and Characterization of Synchrotron Radiation Induced Total Reflection X-ray Fluorescence X-ray Absorption Near Edge Structures at BESSY II BAMLinePräsentation Presentation2015
7Menzel, M. ; Meyer, A. ; Scharf, O. ; Nowak, Sebastian ; Radtke, Martin ; Reinholz, Uwe ; Buzanich, G. ; Hischenhuber, Peter ; Streli, Christina ; Lopez, V.M. ; McIntosh, K. ; Havrilla, G.J. ; Fittschen, U. Shading in TXRF: Calculations and Experimental Validation using a Color X-ray Camera with Subpixel ResolutionPräsentation Presentation2015
8Menzel, M. ; Fittschen, U. ; Scharf, O. ; Nowak, S.H. ; Radke, M. ; Reinholz, Uwe ; Buzanich, G. ; Montoya, V.M. ; Hischenhuber, Peter ; Streli, Christina ; Havrilla, G.J. ; McIntosh, K. Shading Effects in SR-TXRF: Calculations and experimental Visualization Using a Color X-Ray CameraPräsentation Presentation2014
9Fittschen, U. ; Menzel, M. ; Scharf, O. ; Radtke, Martin ; Reinholz, Uwe ; Buzanich, G. ; Montoya, V.M. ; McIntosh, K. ; Horntrich, C. ; Streli, Christina ; Havrilla, G.J. Evaluation of total reflection X-ray fluorescence (TXRF) analysis using a color X-ray camera (CXC)Präsentation Presentation2013
10Fittschen, U. ; Streli, Christina ; Meirer, F. ; Alfeld, M. Determination of phosphorus and other elements in atmospheric aerosols using synchrotron total-reflection X-ray fluorescenceArtikel Article2013
11Horntrich, C. ; Wobrauschek, Peter ; Montoya, V.M. ; Havrilla, G.J. ; Fittschen, U. ; Streli, Christina Determination and production of the ideal TXRF samplePräsentation Presentation2012
12Kregsamer, Peter ; Nutsch, A. ; Borionetti, G. ; Beckhoff, B. ; Müller, M. ; Polignano, M.L. ; Pepponi, Giancarlo ; Fittschen, U. ; Streli, Christina Round robin test for TXRF and ToF-SIMS on various types of Ni samples on Si wafer surfaces within the network ANNAPräsentation Presentation2011
13Horntrich, C. ; Meirer, F. ; Fittschen, U. ; Pepponi, Giancarlo ; Sasamori, S. ; Streli, Christina ; Havrilla, G.J. ; Broekaert, J.A. ; Falkenberg, G. Investigation of saturation effects in TXRF using picodropletsBericht Report2009
14Horntrich, C. ; Sasamori, S. ; Streli, Christina ; Meirer, F. ; Fittschen, U. ; Pepponi, Giancarlo ; Havrilla, G.J. Improvement Of Calibration Processes In Txrf Of Wafer Surface Analysis: Investigation Of Saturation Effects In Txrf By Comparing Picodroplets And MicrodropletsPräsentation Presentation2009
15Horntrich, C. ; Meirer, F. ; Fittschen, U. ; Pepponi, Giancarlo ; Sasamori, S. ; Havrilla, G.J. ; Streli, Christina Improvement of calibration processes in TXRF of wafer surface analysis: Investigation of saturation effects in TXRF by comparing picodroplets and microdropletsPräsentation Presentation2009
16Streli, Christina ; Posch, F. ; Fugger, Manfred ; Havrilla, G.J. ; Fittschen, U. Accreditation (EN ISO 17025) for an Atomika 8030W wafer analyzerPräsentation Presentation2009
17Streli, Christina ; Meirer, F. ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Fittschen, U. ; Broekaert, J.A. ; Zaray, G. ; Falkenberg, G. ; Zaitz, M.A. Synchrotron Radiation Induced Total Reflection X-Ray Fluorescence Analysis-Xanes (SRTXRF-XANES)Präsentation Presentation2008
18Streli, Christina ; Meirer, F. ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Fittschen, U. ; Broekaert, J.A. ; Zaray, G. ; Falkenberg, G. ; Zaitz, M.A. Synchrotron Radiation induced TXRF absorption spectroscopyPräsentation Presentation2008
19Fittschen, U. ; Streli, Christina ; Alfeld, M. ; Meirer, F. Determination of Phosphorus in atmospheric Aerosols using SR-TXRFBericht Report2008
20Streli, Christina ; Meirer, F. ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Fittschen, U. ; Broekaert, J.A. ; Zaray, G. ; Falkenberg, G. ; Zaitz, M.A. Synchrotron Radiation Induced Total Reflection X-Ray Fluorescence Analysis-Xanes (SRTXRF-XANES)Bericht Report2008