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Full name Familienname, Vorname
Meirer, Florian
 
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Own Publications Eigene Publikationen

Results 1-20 of 176 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Siebers, Kirsten ; Brouwer, A.C.M. ; Ingerle, Dieter ; Wobrauschek, Peter ; Streli, Christina ; Meirer, Florian Surface Functionalization for Advanced Sample Preparation in TXRFPresentation Vortrag5-Sep-2023
2Ingerle, D. ; Meirer, F. ; Wobrauschek, Peter ; Streli, Christina Nondestructive characterization of light elements in nanomaterials with GIXRF in the laboratoryPräsentation Presentation2021
3Ingerle, D. ; Meirer, F. ; Wobrauschek, Peter ; Streli, Christina GIXRF for the nondestructive characterization of light element containing nanomaterials in the laboratoryPräsentation Presentation2021
4Ingerle, D. ; Pepponi, Giancarlo ; Meirer, F. ; Artner, W. ; Hradil, K. ; Wobrauschek, Peter ; Streli, Christina Characterization of nanomaterials with GIXRF and XRR using lab sourcesPräsentation Presentation2017
5Ingerle, D. ; Pepponi, Giancarlo ; Meirer, F. ; Wobrauschek, Peter ; Streli, Christina JGIXA - a software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implantsPräsentation Presentation2016
6Mihucz, Victor G. ; Meirer, Florian ; Polgári, Zsófia ; Réti, Andrea ; Pepponi, Giancarlo ; Ingerle, Dieter ; Szoboszlai, Norbert ; Streli, Christina Iron overload of human colon adenocarcinoma cells studied by synchrotron‑based X‑ray techniquesArtikel Article 2016
7Ingerle, D. ; Pepponi, G. ; Meirer, F. ; Wobrauschek, P. ; Streli, C. JGIXA - A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implantsArtikel Article 2016
8Ingerle, D. ; Pepponi, Giancarlo ; Meirer, F. ; Wobrauschek, Peter ; Streli, Christina Measurement, calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implantsPräsentation Presentation2015
9Ingerle, D. ; Wobrauschek, Peter ; Streli, Christina ; Pepponi, Giancarlo ; Leani, J.J. ; Migliori, A. ; Karydas, A.G. ; Eichert, D.M. ; Jark, W. ; Zecevic, J. ; Meirer, F. Comparison of Grazing Incidence X-ray Fluorescence and X-ray Reflectivity Data Obtained at the XRF Beamline of the Elettra Sincrotrone Trieste and an Optimized Lab SpectrometerPräsentation Presentation2015
10Ingerle, D. ; Wobrauschek, Peter ; Streli, Christina ; Pepponi, Giancarlo ; Meirer, F. JGIXA - A Software Package for the Calculation and Fitting of Grazing Incidence X-ray Fluorescence and X-ray Reflectivity Data for the Characterization of Nanometer-layers and Ultra-shallow-implantsPräsentation Presentation2015
11Tirez, K. ; Vanhoof, C. ; Peters, J. ; Geerts, L. ; Bleux, N. ; Adriaenssens, E. ; Roekens, E. ; Smolek, S. ; Maderitsch, A. ; Steininger, R. ; Göttlicher, J. ; Meirer, F. ; Streli, C. ; Berghmans, P. Speciation of inorganic arsenic in particulate matter by combining HPLC/ICP-MS and XANES analysesArtikel Article 2015
12Majer, Z. ; Bösze, Szilvia ; Szabó, I. ; Mihucz, V.G. ; Gaál, A. ; Szilvágyi, G. ; Pepponi, Giancarlo ; Meirer, F. ; Wobrauschek, Peter ; Szoboszlai, N. ; Ingerle, D. ; Streli, Christina Study of dinuclear Rh(II) complexes of phenylalanine derivatives as potential anticancer agents by using X-ray fluorescence and X-ray absorptionArtikel Article 2015
13Vanhoof, Christine ; Tirez, K. ; Peters, J. ; Berghmans, P. ; Cornelis, C. ; Adriaensens, E. ; Roekens, E. ; Meirer, F. ; Smolek, S. ; Maderitsch, A. ; Streli, Christina ; Steiniger, R. ; Güttlicher, J. Total element determination and speciation of arsenic in airborne particulate matter by combining ED/WDXRF, HPLC- ICP-MS and XANES analysesPräsentation Presentation2014
14Ingerle, D. ; Pepponi, Giancarlo ; Meirer, F. ; Schiebl, M. ; Giubertoni, D. ; Demenev, E. ; Wobrauschek, Peter ; Streli, Christina New approach for characterization of ultra-shallow implants by simultaneous evaluation of GIXRF and XRRPräsentation Presentation2014
15Ingerle, D. ; Meirer, F. ; Pepponi, G. ; Demenev, E. ; Giubertoni, D. ; Wobrauschek, P. ; Streli, C. Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributionsArtikel Article2014
16Vanhoof, Christine ; Tirez, K. ; Peters, J. ; Berghmans, P. ; Cornelis, C. ; Adriaensens, E. ; Roekens, E. ; Meirer, F. ; Smolek, S. ; Maderitsch, A. ; Streli, Christina ; Steiniger, R. ; Göttlicher, J. Speciation of Arsenic in aerosol samples with K-edge XANES in fluorescence mode-continuationBericht Report2013
17Meirer, F. ; Ingerle, D. ; Pepponi, Giancarlo ; Streli, Christina ; Mehta, A. ; Pianetta, P. GIXRF and GIXAS at Trace LevelsPräsentation Presentation2013
18Ingerle, D. ; Pepponi, Giancarlo ; Meirer, F. ; Schiebl, M. ; Giubertoni, Damiano ; Demenev, E. ; Wobrauschek, Peter ; Streli, Christina New approach for characterization of ultra-shallow implants by simultaneous evaluation of GIXRF and XRRPräsentation Presentation2013
19Mihucz, V.G. ; Szoboszlai, N. ; Meirer, F. ; Szigeti, T. ; Polgari, Z. ; Ingerle, D. ; Pepponi, Giancarlo ; Appel, K. ; Majer, Z. ; Streli, Christina K-edge TXRF-XANES for elemental speciation in biological matricesPräsentation Presentation2013
20Pepponi, Giancarlo ; Meirer, F. ; Brigidi, Fabio ; Demenev, E. ; Giubertoni, D. ; Gennaro, S. ; Bersani, M. ; Ingerle, D. ; Streli, Christina ; Steinhauser, Georg ; Mehta, A. ; Pianetta, P. ; Vishwanath, V. ; Foad, M.A. GIXRF and GEXRF analysis of PIII ultra shallow arsenic profiles in SiliconPräsentation Presentation2013