Lammel, G.

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Lammel, G.
 

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PreviewAuthors / EditorsTitleTypeIssue Date
1Fittschen, U. ; Broekaert, J.A. ; Hauschild, S. ; Rehder, D. ; Förster, S. ; Streli, Christina ; Wobrauschek, Peter ; Jokubonis, C. ; Meirer, F. ; Pepponi, Giancarlo ; Lammel, G. ; Falkenberg, G. Analysis of Atmospheric aerosols and cell cultures with SR-TXRF: new direct calibration using pico-droplets ( pL) generated by ink-jet printers and speciation of iron with SR-TXRF XANESPräsentation Presentation2006
2Fittschen, U. ; Hauschild, S. ; Amberger, M.A. ; Hess, M. ; Lammel, G. ; Streli, Christina ; Förster, S. ; Wobrauschek, Peter ; Meirer, F. ; Pepponi, Giancarlo ; Falkenberg, G. ; Broekaert, J.A. Elemental Analysis of Aerosols with SR-TXRF: Direct Calibration with Pico-droplets (pL) Generated by Ink-Jet PrintersPräsentation Presentation2006
3Fittschen, U. ; Streli, Christina ; Hauschild, S. ; Lammel, G. ; Rehder, D. ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Meirer, F. ; Jokubonis, C. ; Förster, S. ; Broekaert, J.A. ; Falkenberg, G. SR-TXRF at Beamline L: Direct analysis of aerosols and cell cultures and a new way of calibration with pico dropletsBericht Report2006
4Fittschen, U. ; Hauschild, S. ; Amberger, M.A. ; Lammel, G. ; Streli, Christina ; Förster, S. ; Wobrauschek, Peter ; Jokubonis, C. ; Pepponi, Giancarlo ; Falkenberg, G. ; Broekaert, J.A. A new technique for the deposition of standard solutions in total reflection X-ray fluorescence spectrometry (TXRF) using pico-droplets generated by inkjet printers and its applicability for aerosol analysis with SR-TXRFArtikel Article2006