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Mantler, C.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Sasamori, S. ; Zöger, N. ; Streli, Christina ; Kregsamer, Peter ; Smolek, S. ; Wobrauschek, Peter ; Meirer, F. ; Mantler, C.	Si Wafer Analysis Of Light Elements By Txrf - Chamber Adaption To Fit 6" And 8" Wafers	Präsentation Presentation	2009
	2		Sasamori, S. ; Meirer, F. ; Zöger, N. ; Streli, Christina ; Kregsamer, Peter ; Smolek, S. ; Mantler, C. ; Wobrauschek, Peter	Si wafer analysis of light elements by TXRF-study of absorption effects of metal contaminants	Präsentation Presentation	2009
	3		Sasamori, S. ; Meirer, F. ; Zöger, N. ; Streli, Christina ; Kregsamer, Peter ; Smolek, S. ; Mantler, C. ; Wobrauschek, Peter	Si wafer analysis of light elements by TXRF	Präsentation Presentation	2009
	4		Nutsch, A. ; Beckhoff, B. ; Altmann, R. ; Polignano, M.L. ; Cazzini, E. ; Codegoni, D. ; Borionetti, G. ; Kolbe, M. ; Müller, M. ; Mantler, C. ; Streli, Christina	Comparability of TXRF Systems at different laboratories	Präsentation Presentation	2009
	5		Sasamori, S. ; Meirer, F. ; Zöger, N. ; Streli, Christina ; Kregsamer, Peter ; Smolek, S. ; Mantler, C. ; Wobrauschek, Peter	Si wafer analysis of light elements by TXRF ╨ chamber adaption to fit 6╥ and 8╥ wafers	Präsentation Presentation	2009
	6		Nutsch, A. ; Beckhoff, B. ; Altmann, R. ; Polignano, M.L. ; Borionetti, G. ; Kolbe, M. ; Müller, M. ; Mantler, C. ; Streli, Christina	Comparability of TXRF Systems at different laboratories	Konferenzbeitrag Inproceedings	2009
	7		Sasamori, S. ; Meirer, F. ; Zöger, N. ; Streli, Christina ; Kregsamer, Peter ; Smolek, S. ; Mantler, C. ; Wobrauschek, Peter	Si wafer analysis of light elements by TXRF	Konferenzbeitrag Inproceedings	2009
	8		Pahlke, S. ; Kemmer, J. ; Boslau, O. ; Pahlke, A. ; Stötter, R. ; Mantler, C. ; Wobrauschek, Peter ; Streli, Christina ; Meirer, F.	Large Area VITUS Silicon Drift Detector in TXRF Application	Präsentation Presentation	2007
	9		Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Zöger, N. ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B.	Synchrotron Radiation induced TXRF of low Z Elements on Si Wafer Surfaces at SSRL.Beamline 3-3	Präsentation Presentation	2002
	10		Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W.	Analysis of low Z Elements on Si Wafer Surfaces with Synchrotron Radiation induced TXRF at SSRL.Beamline 3-3: Comparison of Droplets with Spin coated Wafers	Präsentation Presentation	2002
	11		Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Pahlke, S. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W.	Synchrotron Radiation induced TXRF of low Z Elements on Si Wafer Surfaces at SSRL.Beamline 3-3: Surface Contaminations and Depth Profiles	Präsentation Presentation	2002
	12		Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Pianetta, P. ; Baur, K. ; Fabry, L. ; Mantler, C. ; Kanngießer, B. ; Malzer, W.	Synchrotron radiation induced TXRF of low Z elements on Si wafer surfaces at SSRL beamline 3-3	Präsentation Presentation	2002