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Hinh, L

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		Preview	Author(s)	Title	Type	Issue Date
	1		Wittmann, Robert ; Puchner, Helmut ; Hinh, L ; Ceric, Hajdin ; Gehring, Andreas ; Selberherr, Siegfried	Simulation of Dynamic NBTI Degradation for a 90 nm CMOS Technology	Konferenzbeitrag Inproceedings	2005
	2		Wittmann, Robert ; Puchner, H ; Hinh, L ; Ceric, Hajdin ; Gehring, Andreas ; Selberherr, Siegfried	Impact of NBTI-driven Parameter Degradation on Lifetime of a 90nm p-MOSFET	Konferenzbeitrag Inproceedings	2005