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Hinh, L
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Author(s)
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Type
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1
Wittmann, Robert
; Puchner, Helmut
; Hinh, L
; Ceric, Hajdin
; Gehring, Andreas
; Selberherr, Siegfried
Simulation of Dynamic NBTI Degradation for a 90 nm CMOS Technology
Konferenzbeitrag
Inproceedings
2005
2
Wittmann, Robert
; Puchner, H
; Hinh, L
; Ceric, Hajdin
; Gehring, Andreas
; Selberherr, Siegfried
Impact of NBTI-driven Parameter Degradation on Lifetime of a 90nm p-MOSFET
Konferenzbeitrag
Inproceedings
2005