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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Pogany, Dionyz ; Fleury, Clement ; Sultan, S.M. ; Ashburn, P ; Chong, H.M.H. ; Vandamme, L.K.J. | Low frequency noise and breakdown analysis of top-down fabricated ZnO nanowire transistors | Präsentation Presentation | 2013 |
| 2 | | Wagner, Paul-Jürgen ; Kaczer, Ben ; Scholten, A ; Reisinger, H. ; Bychikhin, Sergey ; Pogany, Dionyz ; Vandamme, L.K.J. ; Grasser, Tibor | On the Correlation Between NBTI, SILC, and Flicker Noise | Konferenzbeitrag Inproceedings | 2012 |
| 3 | | Pogany, Dionyz ; Zeiner, Clemens ; Bychikhin, Sergey ; Burchhart, Thomas ; Lugstein, Alois ; Vandamme, L.K.J. | RTS and 1/f noise in Ge nanowire transistors | Konferenzbeitrag Inproceedings | 2011 |
| 4 | | Wagner, Paul-Jürgen ; Aichinger, T. ; Grasser, Tibor ; Nelhiebel, M. ; Vandamme, L.K.J. | Possible Correlation between Flicker Noise and Bias Temperature Stress | Konferenzbeitrag Inproceedings | 2009 |
| 5 | | Bychikhin, Sergey ; Vandamme, L.K.J. ; Pogany, Dionyz ; Meneghesso, Gaudenzio ; Zanoni, Enrico | Low frequency noise sources in as-prepared and aged GaN-based light emitting diodes | Artikel Article  | 2005 |
| 6 | | Bychikhin, Sergey ; Vandamme, L.K.J. ; Kuzmik, Jan ; Meneghesso, Gaudenzio ; Levada, S ; Zanoni, Enrico ; Pogany, Dionyz | Accelerated Aging of GaN Light Emitting Diodes Studied by 1/f and RTS Noise | Konferenzbeitrag Inproceedings | 2005 |
