Name Card

Full name Familienname, Vorname
Mamanee, Wasinee
 
Main Affiliation Organisations­zuordnung
 

Own Publications Eigene Publikationen

Results 1-12 of 12 (Search time: 0.033 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Mamanee, W. ; Bychikhin, S. ; Johnsson, D. ; Jensen, N. ; Stecher, M. ; Gornik, E. ; Pogany, D. Effect of Elevated Ambient Temperature on Thermal Breakdown Behavior in BCD ESD Protection Devices Subjected to Long Electrical Overstress PulsesArtikel Article2012
2Mamanee Wasinee - 2012 - Investigation of current filament behavior in smart...pdf.jpgMamanee, Wasinee Investigation of current filament behavior in smart power technology ESD protection devices subjected to long ESD-like pulsesThesis Hochschulschrift 2012
3Pogany, D. ; Bychikhin, S. ; Heer, M. ; Mamanee, W. ; Gornik, E. Application of transient interferometric mapping method for ESD and latch-up analysisArtikel Article2011
4Pogany, Dionyz ; Bychikhin, Sergey ; Heer, Michael ; Mamanee, Wasinee ; Gornik, Erich Application of transient interferometric mapping method for ESD and latch-up analysisPräsentation Presentation2011
5Mamanee, Wasinee ; Johnsson, David ; Bychikhin, Sergey ; Stecher, Matthias ; Esmark, Kai ; Gossner, Harald ; Gornik, Erich ; Rodin, Pavel ; Pogany, Dionyz Pulse risetime effect on current filamentary modes and interaction of current filaments in ESD protection devicesPräsentation Presentation2010
6Pogany, Dionyz ; Bychikhin, Sergey ; Mamanee, Wasinee ; Gornik, Erich ; Johnsson, David ; Esmark, Kai ; Gossner, Harald ; Stecher, Matthias ; Rodin, Pavel Interacting traveling current filaments and spreading fronts in sandwiched semiconductor nanostructuresKonferenzbeitrag Inproceedings2009
7Mamanee, Wasinee ; Bychikhin, Sergey ; Johnsson, David ; Jensen, Nils ; Stecher, Matthias ; Gornik, Erich ; Pogany, Dionyz Effect of Chip Heating on Thermal Breakdown Occurrence in SPT ESD Protection Devices Subjected to 0.5-1µs Long Current PulsesPräsentation Presentation2009
8Pogany, Dionyz ; Bychikhin, Sergey ; Heer, Michael ; Mamanee, Wasinee ; Dubec, Victor ; Gornik, Erich ; Johnsson, David ; Domanski, Krzysztof ; Esmark, Kai ; Stadler, Wolfgang ; Gossner, Harald ; Stecher, Matthias Application of transient interferometric mapping (TIM) technique for analysis of ns time scale thermal and free carrier dynamics in ESD protection devicesPräsentation Presentation2009
9Mamanee, Wasinee ; Johnsson, David ; Rodin, Pavel ; Bychikhin, Sergey ; Dubec, Victor ; Stecher, Matthias ; Gornik, Erich ; Pogany, Dionyz Interaction of traveling current filaments and its relation to a nontrivial thermal breakdown scenario in avalanching bipolar transistorArtikel Article2009
10Johnsson, David ; Mamanee, Wasinee ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Stecher, Matthias Second breakdown in bipolar ESD protection devices during low current long duration stress and its relation to moving current-tubesKonferenzbeitrag Inproceedings2008
11Heer, Michael ; Bychikhin, Sergey ; Mamanee, Wasinee ; Pogany, Dionyz ; Heid, A ; Grombach, P ; Klaussner, M ; Soppa, W. ; Ramler, B Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devicesArtikel Article2007
12Heer, Michael ; Bychikhin, Sergey ; Mamanee, Wasinee ; Pogany, Dionyz ; Heid, A ; Grambach, P ; Klaussner, M ; Soppa, W. ; Ramler, B Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devicesPräsentation Presentation2007