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Kernstock, Ch.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Tyaginov, S. E. ; Starkov, I. A. ; Triebl, O. ; Karner, M. ; Kernstock, Ch. ; Jungemann, C. ; Enichlmair, H. ; Park, J.M. ; Grasser, T.	Impact of gate oxide thickness variations on hot-carrier degradation	Konferenzbeitrag Inproceedings	2012