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Hellström, Per-Erik

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		Preview	Author(s)	Title	Type	Issue Date
	1		Henkel, Christoph ; Hellström, Per-Erik ; Östling, Mikael ; Stöger-Pollach, Michael ; Bethge, Ole ; Bertagnolli, Emmerich	Impact of oxidation and reduction annealing on the electrical properties of Ge/La2O3/ZrO2 gate stacks	Artikel Article	2012
	2		Henkel, Christoph ; Hellström, Per-Erik ; Östling, Mikael ; Bethge, Ole ; Stöger-Pollach, Michael ; Bertagnolli, Emmerich	Impact of Oxidation and Reduction Annealing on the Electrical Properties of Ge/La2O3/ZrO2 Gate Stacks	Konferenzbeitrag Inproceedings	2011