| | Preview | Authors / Editors | Title | Type | Issue Date |
| 1 | | Wu, Zhicheng ; Franco, Jacopo ; Claes, Dieter ; Rzepa, Gerhard ; Roussel, Philippe J. ; Collaert, Nadine ; Groeseneken, Guido ; Linten, Dimitri ; Grasser, Tibor ; Kaczer, Ben | Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling | Konferenzbeitrag Inproceedings | 2019 |
| 2 | | Sharma, Prateek ; Tyaginov, Stanislav ; Rauch, Stewart E. ; Franco, Jacopo ; Makarov, Alexander ; Vexler, Mikhail I. ; Kaczer, Ben ; Grasser, Tibor | Hot-Carrier Degradation Modeling of Decananometer nMOSFETs Using the Drift-Diffusion Approach | Artikel Article | 2017 |
| 3 | | Tyaginov, Stanislav ; Jech, Markus ; Franco, Jacopo ; Sharma, Prateek ; Kaczer, Ben ; Grasser, Tibor | Understanding and Modeling the Temperature Behavior of Hot-Carrier Degradation in SiON n-MOSFETs | Artikel Article | 2016 |
| 4 | | Sharma, Prateek ; Tyaginov, Stanislav ; Rauch, Stewart E. ; Franco, Jacopo ; Kaczer, Ben ; Makarov, Alexander ; Vexler, Mikhail I. ; Grasser, Tibor | A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs | Konferenzbeitrag Inproceedings  | 2016 |
| 5 | | Franco, Jacopo ; Kaczer, Ben ; Roussel, Philippe J. ; Bury, Erik ; Mertens, Hans ; Ritzenthaler, Romain ; Grasser, Tibor ; Horiguchi, Naoto ; Thean, Aaron ; Groeseneken, Guido | NBTI in Si<inf>0.55</inf>Ge<inf>0.45</inf> cladding p-FinFETs: Porting the superior reliability from planar to 3D architectures | Konferenzbeitrag Inproceedings | 2015 |
| 6 | | Tyaginov, Stanislav ; Bina, Markus ; Franco, Jacopo ; Wimmer, Yannick ; Kaczer, Ben ; Grasser, Tibor | On the Importance of Electron-Electron Scattering for Hot-Carrier Degradation | Artikel Article | 2015 |
| 7 | | Kaczer, Ben ; Franco, Jacopo ; Roussel, Philippe J. ; Groeseneken, Guido ; Chiarella, Thomas ; Horiguchi, Naoto ; Grasser, Tibor | Extraction of The Random Component of Time-Dependent Variability Using Matched Pairs | Artikel Article | 2015 |
| 8 | | Bina, Markus ; Tyaginov, Stanislav ; Franco, Jacopo ; Rupp, Karl ; Wimmer, Yannick ; Osintsev, Dmitry ; Kaczer, Ben ; Grasser, Tibor | Predictive Hot-Carrier Modeling of n-Channel MOSFETs | Artikel Article | 2014 |
| 9 | | Tyaginov, Stanislav ; Bina, Markus ; Franco, Jacopo ; Wimmer, Yannick ; Osintsev, Dmitri ; Kaczer, Ben ; Grasser, Tibor | A predictive physical model for hot-carrier degradation in ultra-scaled MOSFETs | Konferenzbeitrag Inproceedings | 2014 |
| 10 | | Franco, Jacopo ; Kaczer, Ben ; Toledano-Luque, María ; Roussel, Philippe J. ; Kauerauf, Thomas ; Mitard, Jérôme ; Witters, Liesbeth ; Grasser, Tibor ; Groeseneken, Guido | SiGe Channel Technology: Superior Reliability Toward Ultra-Thin EOT Devices-Part II: Time-Dependent Variability in Nanoscaled Devices and Other Reliability Issues | Artikel Article | 2013 |
| 11 | | Franco, Jacopo ; Kaczer, Ben ; Roussel, Philippe J. ; Mitard, Jérôme ; Cho, Moonju ; Witters, Liesbeth ; Grasser, Tibor ; Groeseneken, Guido | SiGe Channel Technology: Superior Reliability Toward Ultrathin EOT Devices-Part I: NBTI | Artikel Article | 2013 |
| 12 | | Franco, Jacopo ; Kaczer, Ben ; Mitard, Jerome ; Toledano-Luque, Maria ; Roussel, Philippe J. ; Witters, Liesbeth ; Grasser, Tibor ; Groeseneken, Guido | NBTI Reliability of SiGe and Ge Channel pMOSFETs With SiO2/HfO2 Dielectric Stack | Artikel Article | 2013 |
| 13 | | Toledano-Luque, María ; Kaczer, Ben ; Grasser, Tibor ; Roussel, Philippe J. ; Franco, Jacopo ; Groeseneken, Guido | Toward a Streamlined Projection of Small Device Bias Temperature Instability Lifetime Distributions | Artikel Article | 2013 |