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Inal, K.

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		Preview	Author(s)	Title	Type	Issue Date
	1		de Orio, R. L. ; Gousseau, S. ; Moreau, S. ; Cerice, H. ; Selberherr, S. ; Farcy, A. ; Bay, F. ; Inal, K. ; Montmitonnet, P.	On the material depletion rate due to electromigration in a copper TSV structure	Konferenzbeitrag Inproceedings	2014