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Ritzenthaler, Romain

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		Preview	Author(s)	Title	Type	Issue Date
	1		Chasin, A ; Franco, J. ; Kaczer, Ben ; Putcha, Vamsi ; Weckx, P. ; Ritzenthaler, Romain ; Mertens, H. ; Horiguchi, N. ; Linten, D ; Rzepa, Gerhard	BTI Reliability and Time-Dependent Variability of Stacked Gate-All-Around Si Nanowire Transistors	Konferenzbeitrag Inproceedings	2017
	2		Franco, Jacopo ; Kaczer, Ben ; Roussel, Philippe J. ; Bury, Erik ; Mertens, Hans ; Ritzenthaler, Romain ; Grasser, Tibor ; Horiguchi, Naoto ; Thean, Aaron ; Groeseneken, Guido	NBTI in Si<inf>0.55</inf>Ge<inf>0.45</inf> cladding p-FinFETs: Porting the superior reliability from planar to 3D architectures	Konferenzbeitrag Inproceedings	2015