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Full name Familienname, Vorname
Roussel, Philippe
 

Own Publications Eigene Publikationen

Results 1-6 of 6 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Makarov, Alexander ; Roussel, Philippe ; Bury, Erik ; Vandemaele, Michiel ; Spessot, Alessio ; Linten, Dimitri ; Kaczer, Ben ; Tyaginov, Stanislav Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling ApproachArtikel Article 2020
2Makarov, Alexander ; Kaczer, Ben ; Roussel, Philippe ; Chasin, A ; Vandemaele, Michiel ; Hellings, Geert ; El-Sayed, Al-Moatasem ; Jech, Markus ; Grasser, Tibor ; Linten, D ; Tyaginov, S. E. Simulation Study: the Effect of Random Dopants and Random Traps on Hot-Carrier Degradation in nFinFETsKonferenzbeitrag Inproceedings 2019
3Makarov, Alexander ; Roussel, Philippe ; Bury, Erik ; Vandemaele, Michiel ; Spessot, Alessio ; Linten, Dimitri ; Kaczer, Ben ; Tyaginov, Stanislav On Correlation between Hot-Carrier Stress Induced Device Parameter Degradation and Time-Zero VariabilityKonferenzbeitrag Inproceedings 2019
4Makarov, Alexander ; Kaczer, Ben ; Roussel, Philippe ; Chasin, A ; Vandemaele, Michiel ; Hellings, Geert ; El-Sayed, Al-Moatasem ; Jech, Markus ; Grasser, Tibor ; Linten, D ; Tyaginov, S. E. Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random DopantsKonferenzbeitrag Inproceedings 2019
5Wu, Zhicheng ; Franco, J. ; Vandooren, Anne ; Kaczer, Ben ; Roussel, Philippe ; Rzepa, Gerhard ; Grasser, Tibor Improved PBTI Reliability in Junction-Less FET Fabricated at Low Thermal Budget for 3-D Sequential IntegrationArtikel Article 2019
6Makarov, Alexander ; Kaczer, Ben ; Roussel, Philippe ; Chasin, Adrian ; Grill, Alexander ; Vandemaele, Michiel ; Hellings, Geert ; El-Sayed, Al-Moatasem ; Grasser, Tibor ; Linten, Dimitri ; Tyaginov, Stanislav Stochastic Modeling of the Impact of Random Dopants on Hot-Carrier Degradation in n-FinFETsArtikel Article 2019