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Spessot, Alessio

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		Preview	Author(s)	Title	Type	Issue Date
	1		Makarov, Alexander ; Roussel, Philippe ; Bury, Erik ; Vandemaele, Michiel ; Spessot, Alessio ; Linten, Dimitri ; Kaczer, Ben ; Tyaginov, Stanislav	Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling Approach	Artikel Article	2020
	2		Makarov, Alexander ; Roussel, Philippe ; Bury, Erik ; Vandemaele, Michiel ; Spessot, Alessio ; Linten, Dimitri ; Kaczer, Ben ; Tyaginov, Stanislav	On Correlation between Hot-Carrier Stress Induced Device Parameter Degradation and Time-Zero Variability	Konferenzbeitrag Inproceedings	2019