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Ioannidis, E.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Michl, Jakob ; Grill, Alexander ; Waldhör, Dominic ; Schleich, Christian ; Knobloch, Theresia ; Ioannidis, E. ; Enichlmair, H. ; Minixhofer, R. ; Kaczer, Ben ; Parvais, Bertrand ; Govoreanu, Bogdan ; Radu, I ; Grasser, Tibor ; Waltl, Michael	Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS	Konferenzbeitrag Inproceedings	2021
	2		Michl, J. ; Grill, Alexander ; Stampfer, B. ; Waldhoer, D. ; Schleich, Christian ; Knobloch, T. ; Ioannidis, E. ; Enichlmair, H. ; Minixhofer, R. ; Kaczer, B. ; Parvais, B. ; Govoreanu, Bogdan ; Radu, I. ; Grasser, T. ; Waltl, M.	Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS	Inproceedings Konferenzbeitrag	2021
	3		Tselios, K. ; Stampfer, B. ; Michl, J. ; Ioannidis, E. ; Enichlmair, H. ; Waltl, M.	Distribution of Step Heights of Electron and Hole Traps in SiON nMOS Transistors	Konferenzbeitrag Inproceedings	2020