Waltl, Michael

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Prefix title Titel (vorangestellt)
Senior Scientist Dipl.-Ing. Dr.techn.
 
Full name Familienname, Vorname
Waltl, Michael
 
Postfix title Titel (nachgestellt)
BSc
 

Contributing Publications Mitbeteiligte Publikationen

Results 1-2 of 2 (Search time: 0.001 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Characterization and modeling of charged defects in silicon and D field-effect transistors.pdf.jpgIllarionov, Yury Characterization and modeling of charged defects in silicon and 2D field-effect transistorsThesis Hochschulschrift2016
2Advanced Electrical Characterization of Charge Trapping in MOS Transistors.pdf.jpgStampfer, Bernhard  Advanced Electrical Characterization of Charge Trapping in MOS TransistorsThesis Hochschulschrift2020