Waltl, Michael
Prefix title Titel (vorangestellt)
Senior Scientist Dipl.-Ing. Dr.techn.
Full name Familienname, Vorname
Waltl, Michael
Postfix title Titel (nachgestellt)
BSc
Results 1-2 of 2 (Search time: 0.004 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 |  | Illarionov, Yury | Characterization and modeling of charged defects in silicon and 2D field-effect transistors | Thesis Hochschulschrift | 2016 |
| 2 |  | Stampfer, Bernhard  | Advanced electrical characterization of charge trapping in MOS transistors | Thesis Hochschulschrift | 2020 |