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Biedermann, Kati

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		Preview	Author(s)	Title	Type	Issue Date
	1		Stöger-Pollach, Michael ; Schachinger, Thomas ; Biedermann, Kati ; Beyer, Volkhard	Valence EELS below the limit of inelastic delocalization using conical dark field EFTEM or Bessel beams	Artikel Article	2017
	2		Stöger-Pollach, Michael ; Biedermann, Kati ; Beyer, V.	Band gap measurements of ultra thin buried films using conical darkfield EFTEM and low voltage EFTEM	Konferenzbeitrag Inproceedings	2014