Beyer, Volkhard

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Beyer, Volkhard

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		Preview	Authors / Editors	Title	Type	Issue Date
	1		Stöger-Pollach, Michael ; Schachinger, Thomas ; Biedermann, Kati ; Beyer, Volkhard	Valence EELS below the limit of inelastic delocalization using conical dark field EFTEM or Bessel beams	Artikel Article	2017