Name Card

Full name Familienname, Vorname
Ulm, G.
 

Own Publications Eigene Publikationen

Results 1-16 of 16 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Beckhoff, B. ; Gerlach, M. ; Kolbe, M. ; Müller, Martin ; Ulm, G. ; Karydas, A.G. ; Zarkadas, Ch. ; Geralis, T. ; Kousuris, K. ; Kawahara, N. ; Yamada, T. ; Mantler, Michael Enhancement of x-ray fluorescence of light elements by photoelectron secondary excitationPräsentation Presentation2006
2Beckhoff, B. ; Gerlach, M. ; Kolbe, M. ; Müller, Martin ; Ulm, G. ; Karydas, A.G. ; Zarkadas, Ch. ; Geralis, T. ; Kousouris, K. ; Kawahara, N. ; Yamada, T. ; Mantler, Michael Quantitative investigation of the enhancement of X-ray fluorescence of light elements by photoelectron secondary exitationPräsentation Presentation2005
3Mantler, Michael ; Beckhoff, B. ; Kolbe, M. ; Ulm, G. Evaluation of fundamental parameter based XRF at well known excitation and detection conditions by complete standardless quantitationPräsentation Presentation2004
4Mantler, Michael ; Beckhoff, B. ; Kolbe, M. ; Ulm, G. Comparison of computed absolute fluorescence photon counts with data from fully calibrated beam lines and detectors at PTB/Bessy-IIPräsentation Presentation2004
5Beckhoff, B. ; Mantler, Michael ; Bavdaz, M. ; Frazer, G. ; Krumrey, M. ; Kolbe, M. ; Owens, A. ; Peacock, A. ; Pullan, D. ; Scholze, F. ; Ulm, G. Evaluation of Complete Standardless Quantitation for Synchrotron Radiation Induced X/Ray Fluorescence AnalysisPräsentation Presentation2003
6Kawahara, N. ; Yamada, T. ; Beckhoff, B. ; Ulm, G. ; Herbst, R. ; Mantler, Michael Investigation of Secondary Excitation Effects in X-Ray Fluorescence Analysis for the Low-Energetic RegionPräsentation Presentation2002
7Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. Synchrotron Radiation induced TXRF of low Z Elements: Analysis of Si Wafer Surfaces at the PTB Undulator PGB Beamline at BESSYIIPräsentation Presentation2002
8Ehmann, T. ; Pepponi, Giancarlo ; Beckhoff, B. ; Fabry, L. ; Streli, Christina ; Wobrauschek, Peter ; Ulm, G. ; Pahlke, S. Investigation of organic Contaminations on Si Wafers by TXRF-NEXAFSPräsentation Presentation2002
9Beckhoff, B. ; Fliegauf, R. ; Ulm, G. ; Weser, J. ; Pepponi, Giancarlo ; Streli, Christina TXRF analysis of low Z elements and TXRF-NEXAFS specification of organic contaminations on silicon wafer surfaces excited by monochromatized undulatorPräsentation Presentation2002
10Pepponi, Giancarlo ; Beckhoff, B. ; Ehmann, T. ; Ulm, G. ; Streli, Christina TXRF-NEXAFS investigation of organic contamination on Si wafersPräsentation Presentation2002
11Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. Synchrotron radiation induced TXRF of low Z elements at the PTB undulator beamline at BESSY II: analysis of Si wafer surfacesPräsentation Presentation2002
12Pepponi, Giancarlo ; Beckhoff, B. ; Ehmann, T. ; Streli, Christina ; Wobrauschek, Peter ; Ulm, G. ; Pahlke, S. ; Fabry, L. Analysis of intentionally contaminated Si Wafers with TXRF-NEXAFSPräsentation Presentation2002
13Pepponi, Giancarlo ; Streli, Christina ; Beckhoff, B. ; Ulm, G. ; Ehmann, T. ; Pahlke, S. ; Fabry, L. NEXAFS Spectroscopy of Organic Contamination on Si Wafers by TXRFPräsentation Presentation2002
14Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. Analysis of low Z Elements on Si Wafer Surfaces with Synchrotron Radiation induced TXRF of low Z Elements at the PTB Undulator Beamline at BESSYPräsentation Presentation2002
15Pepponi, Giancarlo ; Beckhoff, B. ; Ehmann, T. ; Ulm, G. ; Streli, Christina ; Pahlke, S. ; Fabry, L. NEXAFS Spectroscopy of organic Contamination on Si Wafers by TXRF: First ResultsPräsentation Presentation2002
16Streli, Christina ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Beckhoff, B. ; Ulm, G. ; Pahlke, S. ; Fabry, L. ; Ehmann, T. ; Kanngießer, B. ; Malzer, W. Synchrotron Radiation induced TXRF of low Z Elements: Analysis of Si Wafer Surfaces at the PTB Undulator Beamline at BESSY II - recent ResultsPräsentation Presentation2002