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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Rotella, H. ; Caby, B. ; Ménesguen, Y. ; Mazel, Y. ; Valla, A. ; Ingerle, D. ; Detlefs, B. ; Lépy, M.-C. ; Novikova, A. ; Rodriguez, G. ; Streli, C. ; Nolot, E. | Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis | Artikel Article  | 2017 |
| 2 | | Rotella, H. ; Caby, B. ; Ménesguen, Y. ; Ingerle, D. ; Novikova, A. ; Detlefs, B. ; Lépy, M. C. ; Licitra, C. ; Rodriguez, G. ; Streli, Christina ; Nolot, E. | Elemental depth profiling in indium free TCO thin films for optoelectronic applications | Präsentation Presentation | 2016 |
| 3 | | Caby, B. ; Detlefs, B. ; Picot, G. ; Nolot, E. ; Brigidi, Fabio ; Pepponi, Giancarlo ; Ingerle, D. ; Streli, Christina ; Lutterotti, L. ; Chateigner, D. ; Morales, M. | Comparison of Four Data Analysis Software for Combined X-ray Reflectivity and Grazing Incidence X-ray Fluorescence Measurements | Präsentation Presentation | 2015 |
| 4 | | Caby, Bérenger ; Brigidi, Fabio ; Ingerle, D. ; Nolot, E. ; Pepponi, Giancarlo ; Streli, Christina ; Lutterotti, L. ; André, A. ; Rodriguez, G. ; Gergaud, P. ; Morales, M. ; Chateigner, D. | Study of annealing-induced interdiffusion in In2O3/Ag/In2O3 structures by a combined X-ray reflectivity and grazing incidence X-ray fluorescence analysis | Artikel Article | 2015 |
| 5 | | Caby, B. ; Ingerle, D. ; Pepponi, Giancarlo ; Streli, Christina ; Nolot, E. ; Mazen, F. ; Morales, M. ; Chateigner, D. | XRR & GiXRF combined analysis of Plasma Immersion Ion Implantation Ultra-Shallow junctions | Präsentation Presentation | 2014 |
| 6 | | Caby, B. ; Nolot, E. ; Chateigner, D. ; Morales, M. ; Streli, Christina ; Pepponi, Giancarlo ; Gergaud, P. ; Lutterotti, L. ; Ingerle, D. ; Brigidi, Fabio | XRR & GiXRF combined analysis of TCO/metal/TCO structures for photovoltaic applications | Präsentation Presentation | 2013 |