Full name Familienname, Vorname
Eichert, D.M.
 

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PreviewAuthor(s)TitleTypeIssue Date
1Turyanskaya, A. ; Perneczky, L. ; Rauwolf, Mirjam ; Wobrauschek, Peter ; Streli, Christina ; Eichert, D.M. ; Brigidi, Fabio ; Jark, W. ; Bjeoumikhova, S. ; Pepponi, Giancarlo ; Roschger, P. Implementation of a Confocal SR-microXRF System for Bone Analysis at the X-ray Fluorescence Beam Line at ElettraPräsentation Presentation2017
2Prost, Josef ; Zinkl, A. ; Ingerle, D. ; Wobrauschek, Peter ; Streli, Christina ; Eichert, D.M. ; Jark, W. ; Pepponi, Giancarlo ; Migliori, A. ; Karydas, A.G. ; Czyzycki, M. ; Buzanich, G. ; Reinholz, Uwe ; Riesemeier, Heinrich ; Radtke, Martin Applica on of SR-TXRF-XANES for the Analysis of Indoor Aerosol Samples at BESSYII and ELETTRAPräsentation Presentation2017
3Prost, Josef ; Zinkl, A. ; Ingerle, D. ; Sterba, Johannes H. ; Wobrauschek, Peter ; Streli, Christina ; Eichert, D.M. ; Jark, W. ; Pepponi, Giancarlo ; Migliori, A. ; Karydas, A.G. ; Czyzycki, M. ; Buzanich, G. ; Reinholz, Uwe ; Riesemeier, Heinrich ; Radtke, Martin Trace Element Analysis of Airborne Particulate Matter with TXRF and SR-TXRF-XANESPräsentation Presentation2017
4Ingerle, D. ; Wobrauschek, Peter ; Streli, Christina ; Pepponi, Giancarlo ; Leani, J.J. ; Migliori, A. ; Karydas, A.G. ; Eichert, D.M. ; Jark, W. ; Zecevic, J. ; Meirer, F. Comparison of Grazing Incidence X-ray Fluorescence and X-ray Reflectivity Data Obtained at the XRF Beamline of the Elettra Sincrotrone Trieste and an Optimized Lab SpectrometerPräsentation Presentation2015