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Ioannidis, Eleftherios

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		Preview	Author(s)	Title	Type	Issue Date
	1		Tselios, Konstantinos ; Waldhör, Dominic ; Stampfer, Bernhard ; Michl, Jakob ; Ioannidis, Eleftherios ; Enichlmair, H. ; Grasser, Tibor ; Waltl, Michael	On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors	Artikel Article	2021