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Feil, Maximilian W.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Schleich, Christian ; Waldhoer, Dominic ; Waschneck, Katja ; Feil, Maximilian W. ; Reisinger, Hans ; Grasser, Tibor ; Waltl, Michael	Physical Modeling of Charge Trapping in 4H-SiC DMOSFET Technologies	Artikel Article	2021