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Ihle, Sebastian

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		Preview	Author(s)	Title	Type	Issue Date
	1		Müller-Caspary, Knut ; Krause, Florian ; Béché, Armand ; Duchamp, Martial ; Schowalter, Marco ; Löffler, Stefan ; Migunov, Vadim ; Winkler, Florian ; Huth, Martin ; Ritz, Robert ; Ihle, Sebastian ; Simson, Martin ; Ryll, Henning ; Soltau, Heike ; Strüder, Lothar ; Zweck, Josef ; Schattschneider, Peter ; Dunin-Borkowski, Rafal ; Verbeeck, Johan ; Rosenauer, Andreas	Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors.	Artikel Article	1-Jul-2016