Record link: 
http://hdl.handle.net/20.500.12708/149003
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Title: 
Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors.
en
Citation: 
Müller-Caspary, K., Krause, F., Béché, A., Duchamp, M., Schowalter, M., Löffler, S., Migunov, V., Winkler, F., Huth, M., Ritz, R., Ihle, S., Simson, M., Ryll, H., Soltau, H., Strüder, L., Zweck, J., Schattschneider, P., Dunin-Borkowski, R., Verbeeck, J., & Rosenauer, A. (2016). Measurement of Atomic Electric Fields by Scanning Transmission Electron  Microscopy (STEM) Employing Ultrafast Detectors. Microscopy and Microanalysis, 22(S3), 484–485. https://doi.org/10.1017/s1431927616003275
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Publisher DOI: 
10.1017/s1431927616003275
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Publication Type: 
Article - Original Research Article
en
Language: 
English
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Authors: 
Müller-Caspary, Knut 
Krause, Florian 
Béché, Armand 
Duchamp, Martial 
Schowalter, Marco 
Löffler, Stefan 
Migunov, Vadim 
Winkler, Florian 
Huth, Martin 
Ritz, Robert 
Ihle, Sebastian 
Simson, Martin 
Ryll, Henning 
Soltau, Heike 
Strüder, Lothar 
Zweck, Josef 
Schattschneider, Peter 
Dunin-Borkowski, Rafal 
Verbeeck, Johan 
Rosenauer, Andreas 
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Organisational Unit: 
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie 
E138-03 - Forschungsbereich Functional and Magnetic Materials 
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Journal: 
Microscopy and Microanalysis 
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ISSN: 
1431-9276
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Date (published): 
1-Jul-2016
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Number of Pages: 
2
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Publisher: 
CAMBRIDGE UNIV PRESS
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Peer reviewed: 
Yes
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Keywords: 
Instrumentation
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Research Areas: 
Structure-Property Relationship: 30%
Materials Characterization: 40%
Quantum Modelling and Simulation: 30%
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Science Branch: 
Physik, Astronomie
Chemie
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