DC Field
Value
Language
dc.contributor.author
Müller-Caspary, Knut
-
dc.contributor.author
Krause, Florian
-
dc.contributor.author
Béché, Armand
-
dc.contributor.author
Duchamp, Martial
-
dc.contributor.author
Schowalter, Marco
-
dc.contributor.author
Löffler, Stefan
-
dc.contributor.author
Migunov, Vadim
-
dc.contributor.author
Winkler, Florian
-
dc.contributor.author
Huth, Martin
-
dc.contributor.author
Ritz, Robert
-
dc.contributor.author
Ihle, Sebastian
-
dc.contributor.author
Simson, Martin
-
dc.contributor.author
Ryll, Henning
-
dc.contributor.author
Soltau, Heike
-
dc.contributor.author
Strüder, Lothar
-
dc.contributor.author
Zweck, Josef
-
dc.contributor.author
Schattschneider, Peter
-
dc.contributor.author
Dunin-Borkowski, Rafal
-
dc.contributor.author
Verbeeck, Johan
-
dc.contributor.author
Rosenauer, Andreas
-
dc.date.accessioned
2023-02-07T08:48:38Z
-
dc.date.available
2023-02-07T08:48:38Z
-
dc.date.issued
2016-07-01
-
dc.identifier.citation
<div class="csl-bib-body"> <div class="csl-entry">Müller-Caspary, K., Krause, F., Béché, A., Duchamp, M., Schowalter, M., Löffler, S., Migunov, V., Winkler, F., Huth, M., Ritz, R., Ihle, S., Simson, M., Ryll, H., Soltau, H., Strüder, L., Zweck, J., Schattschneider, P., Dunin-Borkowski, R., Verbeeck, J., &#38; Rosenauer, A. (2016). Measurement of Atomic Electric Fields by Scanning Transmission Electron  Microscopy (STEM) Employing Ultrafast Detectors. <i>Microscopy and Microanalysis</i>, <i>22</i>(S3), 484–485. https://doi.org/10.1017/s1431927616003275</div> </div>
-
dc.identifier.issn
1431-9276
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/149003
-
dc.language.iso
en
-
dc.publisher
CAMBRIDGE UNIV PRESS
-
dc.relation.ispartof
Microscopy and Microanalysis
-
dc.subject
Instrumentation
-
dc.title
Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors.
en
dc.type
Artikel
de
dc.type
Article
en
dc.description.startpage
484
-
dc.description.endpage
485
-
dc.type.category
Original Research Article
-
tuw.container.volume
22
-
tuw.container.issue
S3
-
tuw.journal.peerreviewed
true
-
tuw.peerreviewed
true
-
tuw.researchTopic.id
M8
-
tuw.researchTopic.id
M2
-
tuw.researchTopic.id
Q3
-
tuw.researchTopic.name
Structure-Property Relationship
-
tuw.researchTopic.name
Materials Characterization
-
tuw.researchTopic.name
Quantum Modelling and Simulation
-
tuw.researchTopic.value
30
-
tuw.researchTopic.value
40
-
tuw.researchTopic.value
30
-
dcterms.isPartOf.title
Microscopy and Microanalysis
-
tuw.publication.orgunit
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie
-
tuw.publication.orgunit
E138-03 - Forschungsbereich Functional and Magnetic Materials
-
tuw.publisher.doi
10.1017/s1431927616003275
-
dc.identifier.eissn
1435-8115
-
dc.description.numberOfPages
2
-
wb.sci
true
-
wb.sciencebranch
Physik, Astronomie
-
wb.sciencebranch
Chemie
-
wb.sciencebranch.oefos
1030
-
wb.sciencebranch.oefos
1040
-
item.openairecristype
http://purl.org/coar/resource_type/c_2df8fbb1
-
item.fulltext
no Fulltext
-
item.openairetype
research article
-
item.cerifentitytype
Publications
-
item.grantfulltext
none
-
item.languageiso639-1
en
-
crisitem.author.dept
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie
-
crisitem.author.dept
E138 - Institut für Festkörperphysik
-
crisitem.author.dept
E138 - Institut für Festkörperphysik
-
crisitem.author.orcid
0000-0003-0080-2495
-
crisitem.author.parentorg
E057 - Facilities und Zentren
-
crisitem.author.parentorg
E130 - Fakultät für Physik
-
crisitem.author.parentorg
E130 - Fakultät für Physik
-
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