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Debacker, P.
 

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PreviewAuthor(s)TitleTypeIssue Date
1Kaczer, B. ; Franco, J. ; Weckx, P. ; Roussel, Ph.J. ; Simicic, M. ; Putcha, V. ; Bury, E. ; Cho, M. ; Degraeve, R. ; Linten, D. ; Groeseneken, G. ; Debacker, P. ; Parvais, B. ; Raghavan, P. ; Catthoor, F. ; Rzepa, G. ; Waltl, M. ; Goes, W. ; Grasser, T. The Defect-Centric Perspective of Device and Circuit Reliability - From Gate Oxide Defects to CircuitsArtikel Article 2016