Statistics: Proceedings of 2014 IEEE the International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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Geo Map

Region #
EU - Europe 106
AS - Asia, other 4
NA - North America 4
Total 114
Country #
AT - Austria 105
US - United States of America 4
SG - Singapore 2
CN - China 1
DE - Germany 1
IN - India 1
Total 114
City #
Vienna 27
Wiener Neustadt 4
Boardman 2
Malappuram 1
New York 1
Shanghai 1
Unknown 78
Total 114


Year Jan Feb Mar Apr May Jun Jul Aug Sep Oct Nov Dec Tot
2022 00 0000 0262713 12 69
2023 51 4216 0212 43 31
2024 27 1211 0000 00 14
Ever 114