Statistics: Proceedings of 2014 IEEE the International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

From:   ever     To:   now     Change data

Geo Map

Region #
EU - Europe 3
AS - Asia, other 2
Total 5
Country #
AT - Austria 2
SG - Singapore 2
DE - Germany 1
Total 5
City #
Singapore 1
Unknown 4
Total 5


Year Jan Feb Mar Apr May Jun Jul Aug Sep Oct Nov Dec Tot
2022 00 0000 0200 00 2
2023 00 0000 0001 01 2
2024 00 0100 0000 00 1
Ever 5