DC Field
Value
Language
dc.contributor.editor
Waltl, Michael
-
dc.contributor.editor
Filipovic, Lado
-
dc.contributor.editor
Grill, Alexander
-
dc.contributor.editor
Knobloch, Theresia
-
dc.contributor.editor
Nelhiebel, Michael
-
dc.contributor.editor
Waldhör, Dominic
-
dc.date.accessioned
2026-10-13T05:43:28Z
-
dc.date.available
2026-10-13T05:43:28Z
-
dc.date.issued
2026-09-21
-
dc.identifier.citation
<div class="csl-bib-body"> <div class="csl-entry">Waltl, M., Filipovic, L., Grill, A., Knobloch, T., Nelhiebel, M., &#38; Waldhör, D. (Eds.). (2026). <i>ESREF 2026 : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis : Technical Program</i>. https://doi.org/10.34726/12821</div> </div>
-
dc.identifier.isbn
978-3-200-11591-0
-
dc.identifier.uri
http://hdl.handle.net/20.500.12708/231504
-
dc.identifier.uri
https://doi.org/10.34726/12821
-
dc.language.iso
en
-
dc.rights.uri
https://creativecommons.org/licenses/by-nc-nd/4.0/
-
dc.subject
ESREF
en
dc.subject
Semiconductor Device Reliability
en
dc.subject
Failure Analysis
en
dc.subject
Microelectronics
en
dc.subject
Power Semiconductor Devices
en
dc.subject
Electronic Packaging Reliability
en
dc.subject
Defect Characterization
en
dc.subject
Nanoelectronics
en
dc.title
ESREF 2026 : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis : Technical Program
en
dc.type
Proceedings
en
dc.type
Tagungsband
de
dc.rights.license
Creative Commons Namensnennung - Nicht kommerziell - Keine Bearbeitungen 4.0 International
de
dc.rights.license
Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International
en
dc.identifier.doi
10.34726/12821
-
dc.contributor.editoraffiliation
IMEC, Belgium
-
dc.contributor.editoraffiliation
KAI/Infineon, Villach, Austria
-
dc.type.category
Abstract Book
-
tuw.researchTopic.id
C6
-
tuw.researchTopic.id
C1
-
tuw.researchTopic.name
Modeling and Simulation
-
tuw.researchTopic.name
Computational Materials Science
-
tuw.researchTopic.value
50
-
tuw.researchTopic.value
50
-
tuw.publication.orgunit
E360 - Institut für Mikroelektronik
-
dc.identifier.libraryid
AC18069562
-
dc.description.numberOfPages
134
-
dc.rights.identifier
CC BY-NC-ND 4.0
de
dc.rights.identifier
CC BY-NC-ND 4.0
en
tuw.editor.orcid
0000-0001-6042-759X
-
tuw.editor.orcid
0000-0003-1687-5058
-
tuw.editor.orcid
0000-0003-1615-1033
-
tuw.editor.orcid
0000-0001-5156-9510
-
tuw.editor.orcid
0000-0002-8631-5681
-
wb.sciencebranch
Elektrotechnik, Elektronik, Informationstechnik
-
wb.sciencebranch.oefos
2020
-
wb.sciencebranch.value
100
-
item.openairetype
conference proceedings
-
item.cerifentitytype
Publications
-
item.openaccessfulltext
Open Access
-
item.fulltext
with Fulltext
-
item.grantfulltext
mixedopen
-
item.languageiso639-1
en
-
item.mimetype
application/pdf
-
item.openairecristype
http://purl.org/coar/resource_type/c_f744
-
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