35th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ESREF 2024: Proceedings

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		Preview	Author(s)	Title	Type	Issue Date
	1		Hofer, Anton Marco ; Koller, Christian ; Modolo, Nicola ; Pogany, Dionyz ; Ostermaier, Clemens	Improved CV characterization technique for interface state evaluation in Si3N4/n-GaN MIS Capacitors	Inproceedings Konferenzbeitrag	25-Sep-2024