2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Book title Buchtitel

ISBN

979-8-3503-6061-5

Results 1-1 of 1 (Search time: 0.002 seconds).

RIS EndNote Bibtex

		Preview	Author(s)	Title	Type	Issue Date
	1		Bendra, Mario ; Lacerda de Orio, Roberto ; Goes, W. ; Selberherr, Siegfried ; Sverdlov, Viktor	Investigating Reliability Issues in Multi-Layered STT-MRAM with Synthetic Antiferromagnets	Inproceedings Konferenzbeitrag	2024