2024 IEEE International Reliability Physics Symposium (IRPS)

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979-8-3503-6976-2

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		Preview	Author(s)	Title	Type	Issue Date
	1		Grasser, Tibor ; Feil, Maximilian ; Waschneck, Katja ; Reisinger, Hans ; Berens, Judith ; Waldhör, Dominic ; Vasilev, Alexander ; Waltl, Michael ; Aichinger, Thomas ; Bockstedte, Michel ; Gustin, Wolfgang ; Pobegen, Gregor	A Recombination-Enhanced-Defect-Reaction-Based Model for the Gate Switching Instability in SiC MOSFETs	Inproceedings Konferenzbeitrag	2024