2023 International Electron Devices Meeting (IEDM)

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979-8-3503-2768-7

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		Preview	Author(s)	Title	Type	Issue Date
	1		Provias, Alexandros ; Knobloch, Theresia ; Kitamura, A. ; O'Brien, K. P. ; Dorow, C. J. ; Waldhör, Dominic ; Stampfer, Bernhard ; Penumatcha, A. V. ; Lee, S. ; Ramamurthy, R. ; Clendenning, S. ; Waltl, Michael ; Avci, U. ; Grasser, Tibor	Reliability Assessment of Double-Gated Wafer-Scale MoS2 Field Effect Transistors through Hysteresis and Bias Temperature Instability Analyses	Inproceedings Konferenzbeitrag	2023