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Secondary Ion Mass Spectrometry
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Secondary Ion Mass Spectrometry
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Author
6
Hutter, Herbert
5
Fleig, Jürgen
5
Holzlechner, Gerald
3
Kubicek, Markus
2
Larisegger, Silvia
1
Danninger, Herbert
1
Eitenberger, Elisabeth
1
Frömling, Till
1
Huber, Tobias
1
Kaster, Dominik
.
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Date issued
6
2000 - 2024
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Author(s)
Title
Type
Issue Date
1
Slouka, Christoph
; Holzlechner, Gerald
; Fleig, Jürgen
; Hutter, Herbert
High temperature and DC polarisation dependent ionic conduction in donor-doped lead zirconate titanate (PZT) investigated 18O tracer diffusion and impedance spectroscopy
Konferenzbeitrag
Inproceedings
2014
2
Holzlechner, Gerald
; Kubicek, Markus
; Larisegger, Silvia
; Hutter, Herbert
; Fleig, Jürgen
Optimizing ToF-SIMS5 measurements for accurate determination of oxygen isotopic fractions in oxides
Konferenzbeitrag
Inproceedings
2012
3
Kaster, Dominik
; Holzlechner, Gerald
; Hutter, Herbert
; Fleig, Jürgen
Oxide ion diffusion in Pb(ZrxTi1-x)O3 (PZT) under high electric fields investigated by 18O isotope exchange experiments and ToF-SIMS analysis
Konferenzbeitrag
Inproceedings
2012
4
Schintlmeister, Arno
; Frömling, Till
; Fleig, Jürgen
; Hutter, Herbert
Oxygen Transport in Electroceramics Investigated by Electrochemical 18O/16O Isotope Exchange and TOF-SIMS
Konferenzbeitrag
Inproceedings
2008
5
Navickas, Edvinas
; Huber, Tobias
; Holzlechner, Gerald
; Nenning, Andreas
; Kubicek, Markus
; Opitz, Alexander
; Hutter, Herbert
; Fleig, Jürgen
The oxygen exchange and diffusion kinetics of SOFC electrodes studied by Time-of-Flight SIMS
Konferenzbeitrag
Inproceedings
2014
6
Larisegger, Silvia
; Holzlechner, Gerald
; Eitenberger, Elisabeth
; Rogalli, Michael
; Nelhiebel, Michael
; Schulze, Holger
; Kubicek, Markus
; Danninger, Herbert
; Hutter, Herbert
ToF-SIMS Characterization of Passivation Systems for the Copper Metallization in Semiconductor Devices
Konferenzbeitrag
Inproceedings
2012