Secondary Ion Mass Spectrometry

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Secondary Ion Mass Spectrometry
 

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PreviewAuthors / EditorsTitleTypeIssue Date
1Slouka, Christoph ; Holzlechner, Gerald ; Fleig, Jürgen ; Hutter, Herbert High temperature and DC polarisation dependent ionic conduction in donor-doped lead zirconate titanate (PZT) investigated 18O tracer diffusion and impedance spectroscopyKonferenzbeitrag Inproceedings2014
2Holzlechner, Gerald ; Kubicek, Markus ; Larisegger, Silvia ; Hutter, Herbert ; Fleig, Jürgen Optimizing ToF-SIMS5 measurements for accurate determination of oxygen isotopic fractions in oxidesKonferenzbeitrag Inproceedings2012
3Kaster, Dominik ; Holzlechner, Gerald ; Hutter, Herbert ; Fleig, Jürgen Oxide ion diffusion in Pb(ZrxTi1-x)O3 (PZT) under high electric fields investigated by 18O isotope exchange experiments and ToF-SIMS analysisKonferenzbeitrag Inproceedings2012
4Schintlmeister, Arno ; Frömling, Till ; Fleig, Jürgen ; Hutter, Herbert Oxygen Transport in Electroceramics Investigated by Electrochemical 18O/16O Isotope Exchange and TOF-SIMSKonferenzbeitrag Inproceedings2008
5Navickas, Edvinas ; Huber, Tobias ; Holzlechner, Gerald ; Nenning, Andreas ; Kubicek, Markus ; Opitz, Alexander ; Hutter, Herbert ; Fleig, Jürgen ; Navickas, Edvinas The oxygen exchange and diffusion kinetics of SOFC electrodes studied by Time-of-Flight SIMSKonferenzbeitrag Inproceedings2014
6Larisegger, Silvia ; Holzlechner, Gerald ; Eitenberger, Elisabeth ; Rogalli, Michael ; Nelhiebel, Michael ; Schulze, Holger ; Kubicek, Markus ; Danninger, Herbert ; Hutter, Herbert ToF-SIMS Characterization of Passivation Systems for the Copper Metallization in Semiconductor DevicesKonferenzbeitrag Inproceedings2012