The 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

Book title Buchtitel
The 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
 

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PreviewAuthor(s)TitleTypeIssue Date
1Ferringer, Markus ; Fuchs, Gottfried ; Steininger, Andreas ; Kempf, Gerald VLSI Implementation of a Fault-Tolerant Distributed Clock GenerationKonferenzbeitrag Inproceedings 2006