10th IMEKO TC10 International Conference on Technical Diagnostics
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10th IMEKO TC10 International Conference on Technical Diagnostics
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Osanna, Peter Herbert ; Weseslindtner, Helmar ; Durakbasa, M. Numan ; Afjehi-Sadat, Ali | Intelligent Metrology, Quality Assurance and Quality Management as Basis for Technical Diagnostics in Global Competitive Production | Konferenzbeitrag Inproceedings | 2005 |