2008 26th International Conference on Microelectronics
Book title Buchtitel
2008 26th International Conference on Microelectronics
Publisher Herausgeber
IEEE
Place of publishing Erscheinungsort
IEEE Catalog No. CFP08432
Results 1-2 of 2 (Search time: 0.002 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Ceric, H. ; Lacerda de Orio, R. ; Selberherr, S. | Comprehensive modeling of electromigration induced interconnect degradation mechanisms | Konferenzbeitrag Inproceedings | 2008 | |
| 2 | Djinovic, Zoran ; Tomic, Milos ; Manojlovic, Lazo ; Lazic, Zarko ; Smiljanic, Milce M. | Non-contact measurement of thickness uniformity of chemically etched Si membranes by fiber-optic low-coherence interferometry | Konferenzbeitrag Inproceedings | 2008 |