Proceedings 15#^{th} International Symposium on the Physical and Failure Analysis of Integrated Circuits

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Proceedings 15#^{th} International Symposium on the Physical and Failure Analysis of Integrated Circuits
 

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PreviewAuthor(s)TitleTypeIssue Date
1Gös, Wolfgang ; Karner, Markus ; Sverdlov, Viktor ; Grasser, Tibor A Rigorous Model for Trapping and Detrapping in Thin Gate DielectricsKonferenzbeitrag Inproceedings2008
2Ceric, Hajdin ; Orio, Roberto ; Cervenka, Johann ; Selberherr, Siegfried TCAD Solutions for Submicron Copper InterconnectKonferenzbeitrag Inproceedings2008