Proceedings of the 19#^{th} European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
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Proceedings of the 19#^{th} European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Grasser, Tibor ; Kaczer, Ben ; Gös, Wolfgang | An Energy-Level Perspective of Bias Temperature Instability | Konferenzbeitrag Inproceedings | 2008 |