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Record link: 
http://hdl.handle.net/20.500.12708/70647
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Title: 
An Energy-Level Perspective of Bias Temperature Instability
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Citation: 
Grasser, T., Kaczer, B., & Gös, W. (2008). An Energy-Level Perspective of Bias Temperature Instability. In Proceedings of the 19#^{th} European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis  (ESREF), Maastricht, EU. http://hdl.handle.net/20.500.12708/70647
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Publication Type: 
Inproceedings - Full-Paper Contribution
en
Authors: 
Grasser, Tibor 
Kaczer, Ben 
Gös, Wolfgang 
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Organisational Unit: 
E360 - Institut für Mikroelektronik 
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Published in: 
Proceedings of the 19#^{th} European Symposium on Reliability of Electron Devices, Failure Physics and Analysis 
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Date (published): 
2008
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Event name: 
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) 
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Event date: 
29-Sep-2008 - 2-Oct-2008
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Event place: 
Maastricht, EU
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Number of Pages: 
11
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Peer reviewed: 
No
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Science Branch: 
Elektrotechnik, Elektronik
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Appears in Collections:
Conference Paper

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