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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Dubec, Victor ; Bychikhin, Sergey ; Blaho, M. ; Pogany, Dionyz ; Gornik, Erich ; Willemen, Joost ; Qu, N ; Wilkening, W ; Zullino, L. ; Andreini, A. | A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress | Präsentation Presentation | 2003 |
| 2 | | Grasser, Tibor ; Kaczer, Ben ; Gös, Wolfgang | An Energy-Level Perspective of Bias Temperature Instability | Konferenzbeitrag Inproceedings | 2008 |
| 3 | | Ceric, Hajdin ; Zahedmanesh, Houman ; Croes, Kristof | Analysis of Electromigration Failure of Nano-Interconnects through a Combination of Modeling and Experimental Methods | Präsentation Presentation | 2019 |
| 4 | | Heer, Michael ; Dubec, Victor ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Frank, M ; Konrad, A ; Schulz, J | Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up | Präsentation Presentation | 2006 |
| 5 | | Pogany, Dionyz ; Bychikhin, Sergey ; Heer, Michael ; Mamanee, Wasinee ; Gornik, Erich | Application of transient interferometric mapping method for ESD and latch-up analysis | Präsentation Presentation | 2011 |
| 6 | | Heer, Michael ; Dubec, Victor ; Blaho, M. ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Denison, Marie ; Stecher, Matthias ; Groos, Gerhard | Automated setup for thermal imaging and electrical degradation study of power DMOS devices | Präsentation Presentation | 2005 |
| 7 | | Dubec, Victor ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Brodbeck, T ; Stadler, Wolfgang | Backside Interferometric Methods for Localization of ESD-Induced Leakage Current and Metal Shorts | Präsentation Presentation | 2007 |
| 8 | | Pogany, Dionyz ; Esmark, Kai ; Litzenberger, Martin ; Fürböck, Christoph ; Gossner, Harald ; Gornik, Erich | Bulk and surface degradation mode in 0.35um technology gg-nMOS ESD protection devices | Präsentation Presentation | 2000 |
| 9 | | Sharma, Prateek ; Tyaginov, S. E. ; Wimmer, Yannick ; Rudolf, Florian ; Rupp, Karl ; Enichlmair, H. ; Park, J.M. ; Ceric, Hajdin ; Grasser, Tibor | Comparison of Analytic Distribution Function Models for Hot-Carrier Degradation in nLDMOSFETs | Konferenzbeitrag Inproceedings | 2015 |
| 10 | | Stadler, Wolfgang ; Esmark, Kai ; Gossner, Harald ; Streibl, M. ; Wendel, M. ; Fichtner, W. ; Litzenberger, Martin ; Pogany, Dionyz ; Gornik, Erich | Device Simulation and Backside Laser Interferometry - Powerful Tools for ESD Protection Development | Präsentation Presentation | 2002 |
| 11 | | Litzenberger, Martin ; Pichler, R. ; Bychikhin, Sergey ; Pogany, Dionyz ; Esmark, Kai ; Gossner, Harald ; Gornik, Erich | Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection structures | Präsentation Presentation | 2001 |
| 12 | | Fleury, Clement ; Simbürger, Werner ; Pogany, Dionyz | Effect of TLP rise time on ESD failure modes of collector-base junction of SiGe heterojunction bipolar transistors | Präsentation Presentation | 2019 |
| 13 | | Pogany, Dionyz ; Kuzmik, Jan ; Darmo, Juraj ; Litzenberger, Martin ; Bychikhin, Sergey ; Unterrainer, Karl ; Gornik, Erich ; Mozolova, Z. ; Hascik, S. ; Lalinsky, T. | Electrical fied mapping in InGaPHEMTs and GaAs teraherz emitters using backside infrared OBIC technique | Präsentation Presentation | 2002 |
| 14 | | Zisser, Wolfhard ; Ceric, Hajdin ; Weinbub, Josef ; Selberherr, Siegfried | Electromigration Reliability of Open TSV Structures | Konferenzbeitrag Inproceedings | 2014 |
| 15 | | Ayalew, Tesfaye ; Gehring, Andreas ; Grasser, Tibor ; Selberherr, Siegfried | Enhancement of Breakdown Voltage for Ni-SiC Schottky Diodes Utilizing Field Plate Edge Termination | Präsentation Presentation | 2004 |
| 16 | | Rigato, Matteo ; Fleury, Clement ; Heer, Michael ; Simbürger, Werner ; Pogany, Dionyz | ESD characterization of multi-finger RF nMOSFET transistors by TLP and transient interferometric mapping technique | Präsentation Presentation | 2015 |
| 17 | | Heer, Michael ; Bychikhin, Sergey ; Mamanee, Wasinee ; Pogany, Dionyz ; Heid, A ; Grambach, P ; Klaussner, M ; Soppa, W. ; Ramler, B | Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices | Präsentation Presentation | 2007 |
| 18 | | Blaho, M. ; Pogany, Dionyz ; Gornik, Erich ; Zullino, L. ; Andreini, A. | Expermental ans simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions | Präsentation Presentation | 2002 |
| 19 | | Fleury, Clement ; Capriotti, M ; Rigato, Matteo ; Hilt, O ; Würfl, Joachim ; Derluyn, Joff ; Steinhauer, S. ; Köck, Anton ; Strasser, Gottfried ; Pogany, Dionyz | High temperature performances of normally-off p-GaN gate AlGaN/GaN HEMTs on SiC and Si substrates for power applications | Präsentation Presentation | 2015 |
| 20 | | Heer, Michael ; Grombach, P ; Heid, A ; Pogany, Dionyz | Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applications | Präsentation Presentation | 2008 |
