Notice
This item was automatically migrated from a legacy system. It's data has not been checked and might not meet the quality criteria of the present system.
Title: 
Automated setup for thermal imaging and electrical degradation study of power DMOS devices
-
Authors: 
Heer, Michael 
Dubec, Victor 
Blaho, M. 
Bychikhin, Sergey 
Pogany, Dionyz 
Gornik, Erich 
Denison, Marie 
Stecher, Matthias 
Groos, Gerhard 
-
Category: 
Conference presentation
-
Issue Date: 
2005
-
Citation: 
Heer, M., Dubec, V., Blaho, M., Bychikhin, S., Pogany, D., Gornik, E., Denison, M., Stecher, M., & Groos, G. (2005). Automated setup for thermal imaging and electrical degradation study of power DMOS devices. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis  (ESREF), Maastricht, EU. http://hdl.handle.net/20.500.12708/88304
-
Event: 
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) 
-
URI: 
http://hdl.handle.net/20.500.12708/88304
-
Organisation: 
E362 - Institut für Festkörperelektronik 
-
Publication Type: 
Präsentation
de
 
Presentation
en
Appears in Collections:
Presentation

Show full item record

Items in reposiTUm are protected by copyright, with all rights reserved, unless otherwise indicated.

Google ScholarTM

Check