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| | Preview | Authors / Editors | Title | Type | Issue Date |
| 1 | | Litzenberger, Martin ; Fürböck, Christoph ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich | Scanning Heterodyne Interferometer Setup for the Time-Resolved Thermal and Free-Carrier Mapping in Semiconductor Devices | Artikel Article | 2005 |
| 2 | | Gornik, Erich ; Pogany, Dionyz ; Fürböck, Christoph ; Litzenberger, Martin | New characterisation methods for development of ESD protection structures | Bericht Report | 2000 |
| 3 | | Gornik, Erich ; Pogany, Dionyz ; Fürböck, Christoph | Report on failure analysis of semiconductor devices | Bericht Report | 2000 |
| 4 | | Gornik, Erich ; Pogany, Dionyz ; Fürböck, Christoph ; Litzenberger, Martin | Endbericht für Ministery Projekt | Bericht Report | 2000 |
| 5 | | Litzenberger, Martin ; Esmark, Kai ; Pogany, Dionyz ; Fürböck, Christoph ; Gossner, Harald ; Gornik, Erich ; Fichtner, W. | Study of tiggering inhomogeneities in gg-nMOS ESD protection devices via thermal mapping using bachside laser interferometry | Präsentation Presentation | 2000 |
| 6 | | Pogany, Dionyz ; Esmark, Kai ; Litzenberger, Martin ; Fürböck, Christoph ; Gossner, Harald ; Gornik, Erich | Bulk and surface degradation mode in 0.35um technology gg-nMOS ESD protection devices | Präsentation Presentation | 2000 |
| 7 | | Fürböck, Christoph ; Esmark, Kai ; Litzenberger, Martin ; Pogany, Dionyz ; Groos, Gerhard ; Zelsacher, R. ; Stecher, Matthias ; Gornik, Erich | Thermal and free carrier concentration mapping during ESD event in Smart Power ESD protection devices using a modified laser interferometry technique | Präsentation Presentation | 2000 |
